Method and device for plasma-assisted chemical vapour deposition on the inner wall of a hollow body
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 拉尔夫·斯坦
- Publication Date
- 2011-09-28
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
【Technical field】
[0001] The invention relates to a method for plasma-assisted chemical vapor deposition for coating or removing material on the inner wall of a hollow body. 【Background technique】
[0002] This method is already known and is known in technical terms as plasma deposition (PECVD, "plasma enhanced chemical vapor deposition") or ion etching, plasma etching.
[0003] Based on this, the workpiece is placed in a vacuum chamber and held there. The chamber is evacuated until the pressure of the residual gas is in the high vacuum or ultra-high vacuum region, and injected with inert working gas. Next, the low-pressure plasma is introduced into the RF field through the RF electrodes arranged in the vacuum chamber, so that the low-pressure plasma is ignited. In this case, an ionized gas is introduced which contains a considerable proportion of fast-moving free charge carriers, for example ions or electrons.
[0004] In PECVD, a gas called a reactant gas is fed into th...