Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Chip reconfiguration structure provided with analog baseplate and packaging method thereof

A chip packaging and chip technology, applied in the field of semiconductor packaging structure, can solve problems such as displacement, inability to align, and inability to align chips

Active Publication Date: 2009-12-30
CHIPMOS TECH INC
View PDF1 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This thinned chip is reconfigured on another substrate, and then multiple chips are formed into a package by injection molding; because the chip is very thin, the package is also very thin, so when the package is detached After the substrate, the stress of the package itself will cause the package to warp, increasing the difficulty of the subsequent cutting process
[0006] In addition, after wafer dicing, when relocating the chip on another substrate with a size larger than the original substrate, it is necessary to pick up the chip through a pick&place device, and then turn the chip over to flip the chip. The active surface of the chip is attached to the substrate, and in the process of flipping the chip by the pick-and-place device, it is easy to generate tilt (tilt) and cause displacement. For example, if the tilt exceeds 5 microns, the chip will not be aligned. This makes it impossible to align in the subsequent ball planting process, which reduces the reliability of the packaging structure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip reconfiguration structure provided with analog baseplate and packaging method thereof
  • Chip reconfiguration structure provided with analog baseplate and packaging method thereof
  • Chip reconfiguration structure provided with analog baseplate and packaging method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The direction discussed in the present invention is a chip reconfiguration packaging method, a method in which multiple chips are reconfigured on a carrier with a package body and then packaged. In order to provide a thorough understanding of the present invention, detailed steps and components thereof will be set forth in the following description. Clearly, the practice of the present invention is not limited to the specific details of the manner in which the chips are stacked, with which those of ordinary skill are familiar. On the other hand, the well-known chip formation method and detailed steps of chip thinning and other back-end processes are not described in detail to avoid unnecessary limitations of the present invention. However, for the preferred embodiments of the present invention, it will be described in detail as follows, but in addition to these detailed descriptions, the present invention can also be widely implemented in other embodiments, and the scop...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a packaging structure of chip reconfiguration, which comprises a chip, a packaging body, a patterned protection layer, a fan-out patterned metal segment, a second patterned protection layer, a patterned UBM layer and a conductive assembly, wherein the packaging body is annularly covered on four surfaces of the chip so as to expose an active surface and a back surface of the chip out; the patterned protection layer is formed on the surface of the packaging body and covered on the active surface of the chip and exposes a plurality of soldering pads of the chip out; one end of the fan-out patterned metal segment is electrically connected with soldering pads of the chip, and the other end of the fan-out patterned metal segment extends towards the outer side and is covered on the first patterned protection layer; the second patterned protection layer is covered on the patterned metal segment and exposes the partial surface of the patterned metal segment out; the patterned UBM layer is formed on the partial surface of the exposed patterned metal segment; and the conductive assembly is formed on the pattern UBM layer and is electrically connected with the patterned metal segment through the patterned UBM layer.

Description

technical field [0001] The present invention relates to a semiconductor packaging structure and method, in particular to a modular packaging structure formed by using a reconfiguration layer (RDL) after reconfiguring a chip or multiple chips to a carrier with a package and its packaging method. Background technique [0002] Semiconductor technology has developed quite rapidly, so the miniaturized semiconductor chip (Dice) must have diversified functional requirements, so that the semiconductor chip must be configured with more input / output pads (I / O pads) in a small area. O pads), so that the density of metal pins (pins) is also rapidly increased. Therefore, the early lead frame packaging technology is no longer suitable for high-density metal pins; therefore, a ball array (BallGrid Array: BGA) packaging technology has been developed. In addition to the advantages of higher density than lead frame packaging, ball array packaging , and its tin balls are less likely to be da...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/50H01L21/60H01L23/48H01L23/31H01L25/00
CPCH01L24/19H01L24/97H01L2224/12105H01L2224/19H01L2224/24137H01L2924/18162
Inventor 黄成棠
Owner CHIPMOS TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products