Device and method for testing radiation performance of semiconductor lighting product
A heat dissipation performance and detection device technology, which is applied in the field of semiconductor lighting product heat dissipation performance detection devices, can solve the problems of comparison, the inability to perform thermal performance of products with different structures, and restrictions on the research and development, manufacturing and industrialization of semiconductor lighting products, achieving obvious results , optimize product performance, reduce the effect of error
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] The present invention will be described in detail below in conjunction with the accompanying drawings.
[0039] like figure 1 As shown, the present invention provides a heat dissipation performance detection device for semiconductor lighting products, which includes a central monitoring and processing computer 1, a fast radiation power tester 3 connected to the central monitoring and processing computer 1, and an electrical parameter generation and measuring instrument 4 , temperature detector 5, variable environment test integrating sphere 2, parameter analysis and equivalent transformation module 7;
[0040]The physical characteristic parameter input module 6 is used to collect physical characteristic parameters of conductor lighting products; the fast radiant power tester is used to collect radiation rate data of semiconductor lighting products; the electrical parameter generation and measuring instrument is used to input electric power to semiconductor lighting prod...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com