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Device and method for testing radiation performance of semiconductor lighting product

A heat dissipation performance and detection device technology, which is applied in the field of semiconductor lighting product heat dissipation performance detection devices, can solve the problems of comparison, the inability to perform thermal performance of products with different structures, and restrictions on the research and development, manufacturing and industrialization of semiconductor lighting products, achieving obvious results , optimize product performance, reduce the effect of error

Inactive Publication Date: 2010-04-28
SUN YAT SEN UNIV
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The above is the current status of thermal performance testing of semiconductor lighting products. The heat dissipation performance of semiconductor lighting products cannot be systematically and effectively obtained through the current methods and patents, and thermal performance comparisons between products with different structures cannot be carried out. These severely limit semiconductor lighting products. R&D, manufacturing and industrialization development

Method used

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  • Device and method for testing radiation performance of semiconductor lighting product
  • Device and method for testing radiation performance of semiconductor lighting product
  • Device and method for testing radiation performance of semiconductor lighting product

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Embodiment Construction

[0038] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0039] like figure 1 As shown, the present invention provides a heat dissipation performance detection device for semiconductor lighting products, which includes a central monitoring and processing computer 1, a fast radiation power tester 3 connected to the central monitoring and processing computer 1, and an electrical parameter generation and measuring instrument 4 , temperature detector 5, variable environment test integrating sphere 2, parameter analysis and equivalent transformation module 7;

[0040]The physical characteristic parameter input module 6 is used to collect physical characteristic parameters of conductor lighting products; the fast radiant power tester is used to collect radiation rate data of semiconductor lighting products; the electrical parameter generation and measuring instrument is used to input electric power to semiconductor lighting prod...

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Abstract

The invention discloses a device for testing the radiation performance of a semiconductor lighting product, which comprises: a physical property parameter input module which collects the physical property parameters of the semiconductor lighting product; a quick radiation power tester which collects the radiation quantity data of the semiconductor lighting product; an electrical parameter generating and measuring apparatus which inputs power to the semiconductor lighting product and measures the output electrical signal of the semiconductor lighting product; a temperature tester which tests the temperature signals of the internal and external test points of the semiconductor lighting product; a variable-environment test integrating sphere which sets environmental parameters of the semiconductor lighting product; a central monitoring and processing computer which performs computing processing after receiving the parameters; and a parameter analysis and equivalent transform module which performs the uniformized conversion of optical and electrical properties and physical properties of the semiconductor lighting product and calculates the working parameters in an equivalent and standard model state. The central monitoring and processing computer output test data, curves and comprehensive analysis report according to the working parameters. In the invention, the test results can basically restore original use environment and reduce errors caused by difference in test environment.

Description

technical field [0001] The invention belongs to the field of detection of lighting products, and in particular relates to a heat dissipation performance detection device and a detection method of semiconductor lighting products. Background technique [0002] White light LED (Light Emitting Diode), white light emitting diode, referred to as white light LED, is a semiconductor device that can convert electrical energy into white light. The characteristics of the white light LED light source are: the LED uses a low-voltage power supply, and the power supply voltage is 6-24v, which can obtain high enough brightness; the energy consumed by the LED is 80% less than that of an incandescent lamp with the same light effect, and the light-emitting response speed is fast, and the high-frequency characteristics Good, can display pulse information; small size, the shape of the light-emitting surface is divided into circular, rectangular, etc., and there are various specifications, so it ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00G01R31/26G01R31/44
Inventor 王钢贾维卿
Owner SUN YAT SEN UNIV
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