Structured light vision method for measuring three-dimensional profile of restricted space

A technology of structured light and structured light sensor, which is applied in the field of three-dimensional measurement, can solve the problems that cannot fully meet the requirements of three-dimensional shape measurement in a confined space, and cannot measure the inner surface perpendicular to the axial direction, and achieve simple structure, low cost, and improved The effect of robustness

Inactive Publication Date: 2010-06-30
BEIHANG UNIV
View PDF1 Cites 43 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Fan Guangguang and others (Fan Guangguang, Li Ruijun, a new type of three-dimensional shape measurement device based on optical fiber image transmission beam, patent number 200520070076.8) developed a new type of three-dimensional shape measurement device, which realized long-dista

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Structured light vision method for measuring three-dimensional profile of restricted space
  • Structured light vision method for measuring three-dimensional profile of restricted space
  • Structured light vision method for measuring three-dimensional profile of restricted space

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0070] Optoma's EP708 is selected for the projector, and the GCO-23 telecentric imaging lens series of Daheng Optoelectronics is selected for the telecentric imaging lens. According to the measurement requirements of the limited space, the endoscopic camera has the characteristics of small size, high resolution and fast response, so the HX-016HP10 1 / 6-inch endoscopic camera produced by Hangzhou Huaxin Digital Technology Co., Ltd. is selected. The size of the front section of the CCD is controlled within the range of 15mm in diameter, which meets the miniaturization requirements of the measurement system.

[0071] Using the calibration method described in the present invention, the parameters for calibrating the structured light projector are as follows:

[0072] f x p = ( 88 ± 2 ) × 10 1 pixel , ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Login to view more

Abstract

The invention belongs to the technical field of measurement, and provides a structured light vision method for measuring the three-dimensional profile of a restricted space. A miniature structured light vision measurement system is used to enter the restricted space and perform three-dimensional profile measurement. The miniature structured light vision measurement system consists of a structured light projector 1, a structured light sensor 2, an imaging control unit, an image acquisition card and a computer, wherein the structured light projector 1 consists of a projector, a telecentric imaging lens 3, an optical fiber image bundle 4 and a projection lens 5; and the structured light sensor 2 consists of the projection lens 5 of the structured light projector 1, an endoscopic camera 6, a plane reflector 7 and a plane reflector 8. The measurement method comprises the following steps that: the computer generates a sinusoidal structured light pattern; the projector, the telecentric imaging lens 3, the optical fiber image bundle 4 and the projection lens 5 project the pattern onto the surface of an object to be measured; the endoscopic camera 6 shoots a modulated structured light stripe image; and the three-dimensional information of the surface of the object to be measured is calculated according to a measurement model. The method realizes the miniaturization of the structured light sensor, and provides an effective technical means for realizing the off-line and on-line measurement of the three-dimensional profile of the restricted space.

Description

technical field [0001] The invention belongs to the field of three-dimensional measurement and relates to a method for visual measurement of three-dimensional shape structured light in a limited space. Background technique [0002] The measurement of the surface topography of three-dimensional objects, also known as reverse engineering in the field of mechanical manufacturing, plays an increasingly important role in modern processing and manufacturing and actual production. As the non-contact detection technology of the surface shape of three-dimensional objects is more and more widely used in scientific research, medical diagnosis, engineering design, trace analysis of criminal investigation scenes, automatic online detection, quality control, robots and many production processes, people's attention to the three-dimensional shape Measurement requirements are getting higher and higher, and its application fields are also expanding. [0003] In the three-dimensional measurem...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/24
Inventor 周富强李颖蔡斐华
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap