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X-ray optical splitter and mineral composition analyzer

A spectroscope, X-ray technology, applied in the field of optical measurement, can solve the problems of complex optical path system design, curved crystal spectroscope can not be used for mineral composition analyzer, etc. Efficiency-enhancing effect

Active Publication Date: 2010-08-18
BEIJING GENERAL RES INST OF MINING & METALLURGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, the commonly used mineral composition analyzer is wavelength dispersion type at present, and the spectroscopic crystal in the commonly used wavelength dispersion type mineral composition analyzer is a planar structure, but the currently known curved surface crystal spectrometer has not been successfully applied on the mineral composition analyzer. The main reason is that the design of the optical path system of the curved surface spectroscopic crystal is complex, requiring complex optical path structures such as the incident adjustment channel and the exit adjustment channel.
These reasons lead to the fact that curved crystal beam splitters cannot be used in mineral composition analyzers

Method used

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  • X-ray optical splitter and mineral composition analyzer

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Embodiment 1

[0026] The first embodiment provides an X-ray spectrometer, which can be used on a mineral composition analyzer, such as figure 1 As shown, the beam splitter includes:

[0027] Beam splitter shell 1, crystal holder 2, curved beam splitting crystal 3, incident beryllium plate window 4, exit beryllium plate window 5, incident adjustment window 6 and exit slit part 7;

[0028] Wherein, the curved beam-splitting crystal 3 and the crystal holder 2 are both arranged in the beam splitter housing 1, the beam splitter housing 1 has a hexagonal rhombus structure, and the curved beam-splitting crystal 3 is fixedly arranged on the crystal holder 2;

[0029] The incident beryllium sheet window 4 and the outgoing beryllium sheet window 5 are respectively arranged on the sidewalls of the beam splitter shell 1 on both sides of the curved beam splitting crystal 3, and the incident beryllium sheet window 4, the outgoing beryllium sheet window 5 and the curved surface splitting crystal 4 The ar...

Embodiment 2

[0039] The second embodiment provides a mineral composition analyzer, which includes: an X-ray tube, a high-voltage power supply, a characteristic X-ray detector and a signal processing unit, and also includes:

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Abstract

The invention provides an X-ray optical splitter and a mineral composition analyzer, belonging to the technical field of optical measurement. The optical splitter comprises an optical splitter shell, a crystal retainer, a curve optical splitter crystal, an incidence beryllium piece window, an emergence beryllium piece window, an incidence adjusting window and an emergence slit part, wherein the curve optical splitter crystal and the crystal retainer are arranged in the splitter shell, the curve optical splitter crystal is fixedly arranged on the crystal retainer, the incidence beryllium piece window and the emergence beryllium piece window are respectively arranged on the optical splitter shell at two sides of the curve optical splitter crystal, arc reflecting surfaces of the incidence beryllium piece window, the emergence beryllium piece window and the curve optical splitter crystal are distributed in a triangular way, the incidence adjusting window is arranged in the incidence beryllium piece window; and the emergence slit part is arranged on an optical path between the curve optical splitter crystal and the emergence beryllium piece window which are arranged in the optical splitter shell. The optical splitter shortens the X-ray transmission distance, reduces the absorption of X-ray by air in the transmission process, and can improve the resolution ratio and the measurement precision of the mineral composition analyzer.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to an X-ray spectrometer and a mineral composition analyzer. Background technique [0002] There are two types of mineral composition analyzers: wavelength dispersive and energy dispersive. The main difference is whether there is an X-ray spectrometer. The wavelength dispersive mineral composition analyzer with X-ray spectrometer has many advantages over the energy dispersive analyzer, such as its high resolution and high measurement accuracy. Therefore, the commonly used mineral composition analyzer is wavelength dispersion type at present, and the spectroscopic crystal in the commonly used wavelength dispersion type mineral composition analyzer is a planar structure, but the currently known curved surface crystal spectrometer has not been successfully applied on the mineral composition analyzer. The main reason is that the optical path system design of the curved surf...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/22
Inventor 徐宁周俊武赵建军陆博韩龙王庆凯李建国
Owner BEIJING GENERAL RES INST OF MINING & METALLURGY
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