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Rapid vehicle lane line detection device based on parallel processing

A lane line detection and parallel processing technology, applied in the direction of processor architecture/configuration, can solve problems such as limited speed

Active Publication Date: 2013-03-06
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, limited by the existing architecture system, the speed it can achieve is still limited

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  • Rapid vehicle lane line detection device based on parallel processing
  • Rapid vehicle lane line detection device based on parallel processing
  • Rapid vehicle lane line detection device based on parallel processing

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Embodiment Construction

[0073] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail in conjunction with specific embodiments and with reference to the accompanying drawings.

[0074] Such as figure 1 Shown is the system architecture diagram of a fast lane line detection device based on parallel processing, which includes a two-dimensional fully parallel array processor 10 and an array controller 101, and two reduced instruction set processor (RISC) subsystems 11 and 13 , The arbiter 14 for bus switching and two multiplexers 12 and 15, lane line image input and detection result output module. Under the effect of a fast lane line detection algorithm suitable for parallel implementation, the large-scale parallel operation of the fully parallel array processor is used to achieve fast lane line image preprocessing, and then two RISC subsystems are used according to the preprocessing results. The ...

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Abstract

The invention discloses a rapid vehicle lane line detection device based on parallel processing, which comprises a two-dimensional PE (Processor Element) array and two RISC (Reduced Instruction-Set Computer) microprocessor subsystems. The PE array is a two-dimensional large parallel system and is in charge of completing various vehicle lane line image preprocessing tasks capable of being processed in parallel as well as comprising vehicle lane line image filter, edge extraction and enhancement and the like. The two RISC microprocessor systems are used for carrying out vehicle lane line detection on left and right vehicle lane line edge images subjected to the edge enhancement. The PE array is connected with the two RISC microprocessor subsystems through an advanced high-property bus. Vehicle lane line image data are input from the input end of the PE array and output to two parallel RISC core subsystems after being subjected to the PE array filter, edge extraction and enhancement; and a vehicle lane line is detected by the RISC core subsystems. By using the detection system and an algorithm corresponding to the detection system, the rapid detection of the vehicle lane line can be realized.

Description

Technical field [0001] The invention relates to the technical field of assisting safe driving such as rapid detection of lane lines and corresponding application of lane departure warning systems and lane keeping systems, and in particular to a fast lane line detection device based on parallel processing. Background technique [0002] With the rapid growth of car ownership in recent years, more and more traffic accidents caused by cars have made car safety issues increasingly important. How to improve car driving safety is an important social issue and an important research field of scientific and technological development. In recent years, assisted safe driving is one of the effective methods to solve vehicle safety, and the most widely used one is the lane departure warning system. In this system, the key issue is real-time rapid detection of lanes. The existing methods for lane line detection are all based on a computer platform. The algorithm is complex, the speed is very s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B60W30/14B60W40/06G06T1/20
Inventor 李元金张万成吴南健
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI