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Method for coordinating a plurality of independent measuring apparatuses in automatic operation

A technology of measuring instruments and collaborative work, applied in the direction of instruments, comprehensive factory control, comprehensive factory control, etc., can solve the problems of loss of flexibility, high cost of software production, time-consuming and laborious, etc.

Inactive Publication Date: 2010-10-06
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, such software is only suitable for the use of these two instruments and cannot be transplanted to other types of instrument combinations.
[0008] That is to say, this method pursues the comprehensiveness of control and loses flexibility, so that a case is only applicable to a limited number of instruments, and it is time-consuming and laborious, the cost of software production is very high, and the economic and social benefits are not very obvious

Method used

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  • Method for coordinating a plurality of independent measuring apparatuses in automatic operation
  • Method for coordinating a plurality of independent measuring apparatuses in automatic operation
  • Method for coordinating a plurality of independent measuring apparatuses in automatic operation

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Embodiment Construction

[0022] see figure 1 , this method is applicable to the composition of the equipment and the original operation method. The entire instrument cluster 04 consists of several independently operable measuring systems: measuring system 1 to measuring system n. The structures of the n sets of measurement systems are not exactly the same, but they can be summarized into several parts of the measurement system 1: 01 is the instrument control computer directly operated by the experimenter, and the original control and data acquisition and display interfaces of the instrument are all installed in the On the control computer 01, these software interfaces are also the objects to be finally controlled by this method. 02 is the instrument host, which is the core of the entire measurement system, including electrical appliances, machinery, and all execution, control, and measurement units. The instrument host 02 is not discussed in this method. Any form of host can easily realize cooperati...

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Abstract

The invention relates to a large measuring apparatus control system, in particular to a method for using a computer for automatic control when needing an apparatus group consisting of a plurality of independent measuring apparatus systems to coordinate in operation. The method for coordinating a plurality of independent measuring apparatuses in automatic operation comprises the following steps of: connecting the control computers of the whole apparatus group through network equipment, selecting the control computer of an apparatus as the host machine of the apparatus group, controlling the operation time sequences of the apparatus group through the host machine, sending a message to the control computer of each apparatus, and after the control computer of each apparatus receives the corresponding message, locally imitating the action of a mouse keyboard and directly operating a control interface of the apparatus. The method is suitable for coordinating the measuring apparatus group with a Windows operating system in operation under a particular condition that each measuring process is predictable.

Description

technical field [0001] The invention relates to a large measuring instrument control system, in particular to a computer automatic control method when an instrument group composed of a plurality of independent measuring instrument systems is required to work together. Background technique [0002] In scientific research institutes, modern measuring instruments are an important basis for promoting the development of scientific research. Taking earth science as an example, commonly used large-scale instruments include various inorganic mass spectrometers, X-ray fluorescence instruments, electron probes, ion probes, laser probes, etc. to study the chemical composition of minerals and rocks and discuss geological structures. The functions of various instruments are different, the software used for measurement is different, and the production company is also different. [0003] At present, sample analysis tends to be more and more in-situ (analysis is performed at a precise posi...

Claims

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Application Information

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IPC IPC(8): G05B19/418G06F3/048G06F3/0481
CPCY02P90/02
Inventor 刘宇唐国强孙金凤
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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