Clock margin measuring system, method and corresponding device

Abstract

A clock margin test system, method and corresponding device are disclosed in the present invention. The system includes that a clock margin adjustment device, a product system under test and a product performance parameter monitoring device are connected successively. The clock margin adjustment device is set as receiving a clock signal output by a driving clock source of the product system under test, adjusting the reference level and / or amplitude of the clock signal, performing a butt matching processing on the adjusted clock signal, so as to generate the clock signal for butt-matching with the product system under test, and then output the clock signal; the product system under test is set as inputting the clock signal output by the driving clock source of the product system under test into the clock margin adjustment device, receiving the clock signal output by the clock margin adjustment device and providing it as a driving clock to the part, which requires the driving clock, of the product system under test; the product performance parameter monitoring device is set as monitoring the performance parameter of the product under test when the part, which requires the driving clock, of the product system under test works under driving of the driving clock.

Description

technical field [0001] The invention relates to product testing technology, in particular to a clock margin testing system, method and corresponding device for product testing. Background technique [0002] With the continuous deepening of circuit hardware testing, people not only need to ensure the correct implementation of the designed product functions and excellent performance through testing, but also do some margin testing to obtain the specific performance indicators of the product, so that it can be used as much as possible. Have a comprehensive understanding of the designed product. At the same time, margin testing is also of great help to product material selection, product maintenance, and troubleshooting of fault recurrence. In the current situation of fierce competition in the market, product developers should not only care about the function of the product, but also compete with the performance of the product under the same product function, so that the limit ...

AI Technical Summary

Problems solved by technology

Therefore, to test the performance of various products, the test system is inseparable from the test and adjustment of the synchronous clock margin, because if the drive clock of the product exceeds this margin, it may directly cause a certain function of the product to fail to be realized, or cause the product to fail. performance of

[0004] Currently, disclosures about clock phase margin testing technology can be seen in terms of clock margin testing and adjustment, but no related technical reports have been seen in terms of clock amplitude margin testing and adjustment

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