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Detection method and system of electronic device reliability

An electronic device and detection method technology, which is applied in the field of electronic device reliability detection methods and systems, can solve the problems of long detection time, unfavorable feedback of test results, and difficulty in detecting one by one, and achieves the effect of reducing the detection cost and shortening the detection time.

Active Publication Date: 2011-02-16
NANJING ZHONGXING XIN SOFTWARE CO LTD
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Problems solved by technology

However, there are some defects in this test method: first, the high cost and long testing time are not conducive to timely feedback of test results, which prolongs the development and production cycle; second, the environmental stress test itself is destructive, and only samples can be used to evaluate the status of product batches , it is difficult to detect one by one

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  • Detection method and system of electronic device reliability
  • Detection method and system of electronic device reliability
  • Detection method and system of electronic device reliability

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Embodiment 1

[0042] Please refer to figure 1 , is a flow chart of the chip reliability detection in the embodiment of the present invention:

[0043] 101. Select n "random sub-samples" from the "sampling matrix" of the same batch of chips according to the principle of simple random sampling, and use the n "random sub-samples" as sample chips. Generally, the value of n is between 20 and 30 ;

[0044] 102. Accurately measure the static leakage current I of the sample chip S , 1 ~ 100Hz noise voltage value E n , chip power consumption, static leakage current I S , 1 ~ 100Hz noise voltage value E n As a sample value of chip environment sensitive parameters, chip power consumption is used as a sample value of chip performance parameters;

[0045] 103. Carry out environmental stress tests on the sample chip with reference to the relevant national standards for basic environmental tests of electrical and electronic products, and accurately calculate the sample value of the offset of performa...

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Abstract

The invention discloses a detection method and system of electronic device reliability. The method comprises the following steps: building a forecast model relative to the environment sensitive parameter and the offset quantity of the performance parameter of the electronic device; measuring the environment sensitive parameter of the electronic device; forecasting the offset quantity of the performance parameter of the electronic device according to the measured value of the environment sensitive parameter of the electronic device and the forecast model; and determining the reliability of the electronic device according to the offset quantity of the performance parameter. Through the technical scheme, the fast and nondestructive detection of the electronic device one by one can be realized.

Description

technical field [0001] The invention relates to the field of electronic equipment, in particular to a method and system for detecting the reliability of an electronic device. Background technique [0002] At present, the testing method for the reliability of electronic devices is usually to conduct environmental stress tests on electronic devices, that is, by applying a certain amount of environmental stress to electronic devices, such as temperature, humidity, vibration, etc., after a period of time, the environmental stress test before and after The performance parameter offset of the electronic device is obtained by comparing the performance parameters of the test. The electronic device that does not match the target value of the performance parameter offset is considered to be unreliable, such as a chip, which is a communication terminal device that performs functions such as radio frequency and baseband. The device is also one of the electronic devices with a high failu...

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Application Information

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IPC IPC(8): G01R31/28
Inventor 张婧婧
Owner NANJING ZHONGXING XIN SOFTWARE CO LTD