System for measuring normal spectral emissivity of high-temperature material

A technology for spectral emissivity and high-temperature materials, which is applied in the field of normal spectral emissivity measurement systems for high-temperature materials, can solve the problems of high price and complex structure, and achieve the effects of less radiation measurement interference, avoiding limitations, and simple optical path design

Active Publication Date: 2011-05-04
TSINGHUA UNIV +1
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Problems solved by technology

[0004] At present, although the spectral emissivity measurement system based on Fourier spectrometer can achieve high-precision m

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  • System for measuring normal spectral emissivity of high-temperature material
  • System for measuring normal spectral emissivity of high-temperature material
  • System for measuring normal spectral emissivity of high-temperature material

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Embodiment Construction

[0032] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0033] figure 1 A schematic structural diagram of a high-temperature material normal spectral emissivity measurement system of this embodiment is shown, including a vacuum heating unit, a water-cooled sleeve unit, an optical fiber sensor measurement unit, and a data acquisition and analysis unit. The vacuum heating unit heats the lower surface of the test sample in a vacuum environment; the upper surface of the sample is used as the tested surface, and the water-cooled sleeve unit provides a constant temperature and cold environment for the sample test surface; the optical fiber sensor measurement unit realizes the normal spectral radiation of the sample test surface For ...

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Abstract

The invention discloses a system for measuring the normal spectral emissivity of a high-temperature material, comprising a vacuum heating unit, a water cooling sleeve unit, an optical fiber sensor measurement unit and a data acquisition and analysis unit, wherein a test sample is arranged on the upper part of the vacuum heating unit, and the vacuum heating unit performs radiant heating on the lower surface of the test sample; the water cooling sleeve unit is sleeved on the upper part of the test sample, and the upper surface of the test sample is placed in a constant-temperature cold environment; the optical fiber sensor measurement unit is arranged above the test sample to measure the normal spectral radiant intensity of the upper surface of the test sample; and the data acquisition and analysis unit is connected with the optical fiber sensor measurement unit and is used for calculating the normal spectral emissivity through a multi-spectrum inversion algorithm according to the measured normal spectral radiant intensity. The invention realizes material normal spectral emissivity measurement in a spectrum range of 0.4-1.7mum and a temperature range of 600-1,500 DEG C without on-line radiometric calibration, is accurate and reliable to realize the technology, and overcomes limitations on high price, complicated structure, high difficulty in technical implementation and other applications of the conventional spectral emissivity device.

Description

technical field [0001] The invention relates to the technical field of measuring thermophysical parameters of materials, in particular to a measurement system for normal spectral emissivity of high-temperature materials, which is suitable for measuring the surface normal spectral emissivity of high-temperature metal and non-metallic materials. Background technique [0002] The normal spectral emissivity is one of the important thermophysical parameters of materials, which characterizes the spectral radiation ability of the material surface, and is an important basic physical property data for radiation temperature measurement and radiation heat transfer analysis. In the aerospace, petrochemical, metallurgy, steel, cement, glass, microelectronics processing and other industrial fields, radiation temperature measurement is an effective means to solve the online measurement and diagnosis of high temperature in the production process. However, the unknown spectral emissivity of m...

Claims

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Application Information

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IPC IPC(8): G01N25/00G01J3/28
Inventor 符泰然谈鹏曹阳赵桓
Owner TSINGHUA UNIV
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