Sampling point topological neighbor-based method for reconstructing surface topology of scattered point cloud

A technique of scattered points and sample points, applied in the field of product reverse engineering, can solve problems such as poor data adaptability, and achieve the effect of strong algorithm data adaptability

Inactive Publication Date: 2011-05-25
SHANDONG UNIV OF TECH
View PDF0 Cites 52 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] To sum up, the shortcomings of the existing technology are: the surface topology reconstruction of scattered point

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sampling point topological neighbor-based method for reconstructing surface topology of scattered point cloud
  • Sampling point topological neighbor-based method for reconstructing surface topology of scattered point cloud
  • Sampling point topological neighbor-based method for reconstructing surface topology of scattered point cloud

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] For example Figure 5 The Mickey Mouse scattered point cloud is shown for surface topology reconstruction.

[0033] Firstly, for the scattered point cloud formed by the product surface sampling data output by the three-coordinate measuring equipment, the node splitting method based on four-dimensional clustering is used to establish the R*-tree dynamic index. figure 2 It is a schematic diagram of the overall structure of the scattered point cloud spatial clustering index structure established by the scattered point cloud data spatial clustering index structure construction program 2 of the present invention. The data structure of the scattered data space clustering index structure is divided into an index layer and a data layer. The index layer is composed of R*-tree internal nodes, leaf nodes and data nodes; the data layer is a data linked list, and its nodes have access to the upper level Indexing capabilities. Index layer nodes are divided into index nodes and dat...

Embodiment 2

[0041] For example Figure 16 Surface topology reconstruction of the scattered point cloud model of the automobile parts shown.

[0042] First, surface topology reconstruction is carried out on the scattered point cloud. The reconstruction method is the same as that in Example 1. The index parameters m=8 and M=20 used when establishing the spatial clustering index structure of the scattered point cloud are reinserted into the node number R=6, k nearest neighbor query When k is set to 12, the distance threshold in the process of eccentric expansion ε = 27.33mm, the sampling density ρ = 13.03mm, and δ = 3 is set for the area that requires hole processing, the initial result of surface topology reconstruction is as follows Figure 17 shown.

[0043] In order to further meet the process requirements, hole processing is performed on the process hole area, and most areas of the point cloud are approximately uniformly sampled, and the sampling density is ρ. According to the triangul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a sampling point topological neighbor-based method for reconstructing a surface topology of a scattered point cloud. The method is characterized in that: topological neighbor reference data of a target sampling point is acquired by eccentrically extending and adaptively extending the target sampling point and k neighbors thereof; topological neighbors of the target sampling point are queried from the topological neighbor reference data, and matching points meeting the Delaunay condition are acquired from the topological neighbors in the same layer of the target sampling point to generate local Delaunay triangulation; and the surface topological reconstruction of the whole scattered point cloud is realized through increment extension. Instances prove that the method can reasonably reconstruct the surface topology of the scattered point cloud of seamless, border and other models, and effectively solves the problem that non-uniform point cloud easily has non-technological pores.

Description

technical field [0001] The invention provides a method for reconstructing the surface topology of scattered point clouds based on the topological neighbors of sample points, and belongs to the technical field of product reverse engineering. Background technique [0002] Scattered point cloud surface topology reconstruction is mainly used to solve the problem of restoring the adjacency relationship of sample points on the surface of the object, and the output result is embodied as a polygonal mesh surface with a two-dimensional orientable manifold structure. Surface topology reconstruction has important applications in fields such as reverse engineering, medical image processing, virtual reality, and mechanical product measurement and modeling. For example, in the fields of automobiles and aviation, product shape designers need to use scattered The point cloud surface topology reconstruction technology constructs the model triangular mesh surface, and generates CNC machining ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06T17/30
Inventor 孙殿柱孙永伟李延瑞康新才
Owner SHANDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap