Method for testing and method for testing and controlling transmission chip

A technology for transmitting chips and testing methods, which is applied in the field of testing, can solve the problems of lower average price of integrated circuit devices, poor testing flexibility, and increased testing costs, and achieve the effects of convenient expansion, reduced testing costs, and easy implementation

Active Publication Date: 2011-06-29
SANECHIPS TECH CO LTD
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Problems solved by technology

With the continuous improvement of the performance and complexity of current chips, various defects that have never appeared before pose new challenges to traditional testing methods, and manufacturers need to formulate new testing strategies; at the same time, due to the continuous decline in the average price of integrated circuit devices, profits rate is also declining, manufacturers must fully consider the test cost and economic
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  • Method for testing and method for testing and controlling transmission chip
  • Method for testing and method for testing and controlling transmission chip
  • Method for testing and method for testing and controlling transmission chip

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specific Embodiment approach

[0057] A specific implementation of the test method of the transmission chip of the present invention includes: the programmable device generates test data that is sent to the chip under test according to the test case structure; the programmable device processes the test data according to the chip under test and returns the result to the Issue a test report.

[0058] According to an embodiment of the test method of the present invention, the test case includes configuration items of the programmable device, working configuration parameters of the chip to be tested, test function items of the chip to be tested, and expected output values ​​corresponding to the test function items of the chip to be tested.

[0059] According to an embodiment of the test method of the present invention, the programmable device includes an FPGA, and the FPGA is used to receive test data and convert the test data according to the test case into data required for the test. According to an alternati...

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Abstract

The invention discloses a method for testing a transmission chip. The method comprises the following steps: test data sent to a chip to be tested is produced and constructed by programmable equipment in accordance with a test case; and the programmable equipment submits a test report according to the result that the chip to be tested processes and returns the test data. The invention further discloses a method for testing and controlling a transmission chip. Under the condition that an instrument is not depended on, the test data is constructed by the programmable equipment according to the test case; test result is returned to the programmable equipment, and the correctness of the result is judged by the programmable equipment, so that universal test on the chip is realized; by the adoption of the invention, the all-sided automatization of the test execution is realized through the control on test process, thereby improving the test efficiency and lowering the test cost.

Description

technical field [0001] The invention relates to testing technology, in particular to a testing method and a testing control method of a transmission chip. Background technique [0002] Verification and testing play an important role in chip development and have become an integral part of the development process. At present, the difficulties and problems in chip design, testing and manufacturing are gradually increasing, and some are becoming increasingly acute. With the continuous improvement of the performance and complexity of current chips, various defects that have never appeared before pose new challenges to traditional testing methods, and manufacturers need to formulate new testing strategies; at the same time, due to the continuous decline in the average price of integrated circuit devices, profits Rates are also declining, manufacturers must fully consider the test cost and economics. [0003] In the prior art, the test signal is generated by specific equipment an...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 张爱萍
Owner SANECHIPS TECH CO LTD
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