Time resolution elliptical polarization spectrum measuring system

A technology of ellipsometry spectroscopy and measurement system, which is applied in the direction of polarization influence characteristics, etc., and can solve the problems of inability to measure transient optical constants, limitations, etc.

Inactive Publication Date: 2011-09-14
FUDAN UNIV
View PDF11 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current ellipsometry technology is limited to measuring the optical cons...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time resolution elliptical polarization spectrum measuring system
  • Time resolution elliptical polarization spectrum measuring system
  • Time resolution elliptical polarization spectrum measuring system

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach

[0025] 1. The pulsed light emitted by the tunable femtosecond ultrafast laser source 1 is divided into two beams by the beam splitter 2, one is the pump light and the other is the probe light. The intensity of the pump light is generally taken as several times the intensity of the probe light, for example, the ratio of the two is 10:1-4:1.

[0026] 2. After being reflected by the mirror 3, the pump light passes through the delayer 4, the mirror 5, the mirror 6 and the beam expander 7 in sequence, and then is vertically incident on the sample 8.

[0027] 3. The probe light is incident on the sample 8 at a certain angle after passing through the beam expander 9 and the polarizer 10 in sequence.

[0028] 4. After the detection light is reflected by the sample 8, the reflected light passes through a multi-channel analyzer 11 and is detected by a CCD detector 12.

[0029] 5. The measuring system is controlled by the computer control system 13 . The synchronization and delay betwe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of an optical electronic device and particularly relates to a time resolution elliptical polarization spectrum measuring system. The measuring system provided by the invention comprises a laser device, a beam splitter, reflectors, a delayer, a beam expander, a sample, a polarizer, a multi-channel analyzer, a CCD (charge coupled device) detector, a computer system, a stepper motor and the like, wherein the laser device adopts a tunable femtosecond ultrafast laser light source; the pulse light which is emitted from the light source is divided into pump light and detection light through the beam splitter; the pump light is vertically irradiated to the sample after passing through the delayer, the two reflectors and the beam expander; the detection light is irradiated to the sample after passing through the beam expander and the polarizer; the light passes through the multi-channel analyzer after being reflected by the sample and detected by the CCD surface array detector; and a computer computes the corresponding time resolution optical constant spectrum. The time resolution elliptical polarization spectrum measuring system provided by the invention has wide application prospects in multiple fields of physics, chemistry, biomedicine, environmental science and the like.

Description

technical field [0001] The invention belongs to the technical field of optical and electronic devices, and in particular relates to a time-resolved ellipsometry measurement system. Background technique [0002] The interaction between light and matter involves many transient processes, such as electronic transitions in solids, fluorescence emission and internal transformation processes of biological and chemical materials, etc. By measuring the evolution of reflectivity, transmittance or polarization state over time after light passes through the material, the dynamic process inside the substance can be studied, and important information such as the state of motion of molecules or electrons in the substance, such as electronic energy levels and electronic state pairing can be obtained. . When light interacts with matter, the light field causes the polarization of molecules or electrons, resulting in the distribution of molecules or electrons and the evolution of their distr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/21
Inventor 郑玉祥赵海斌陈良尧张荣君李晶王松有杨月梅
Owner FUDAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products