Circuit structure and method for automatically testing analog baseband chip comprising analog-digital converter (ADC) and digital-analog converter (DAC)

Abstract

The invention relates to a circuit structure for automatically testing an analog baseband chip comprising an analog-digital converter (ADC) and a digital-analog converter (DAC). A low-voltage differential signal conversion module is connected with a low-voltage differential signal input end and a low-voltage differential signal output end of the analog baseband chip; an output end of the DAC of the analog baseband chip is connected with an input end of the ADC; the low-voltage differential signal conversion module is connected with a transmit data storage module, a receive data storage module and a transmitting and stopping control module; and the transmit data storage module and the receive data storage module are connected with an external display device via an error calculation module and a test result display module. The invention also relates to a method for automatically testing the analog baseband chip comprising the ADC and the DAC based on the circuit structure. By the circuit structure and the method for automatically testing the analog baseband chip comprising the ADC and the DAC, the testing complexity is reduced, the testing time is shortened, and the testing precision and reliability are improved; and the process is convenient and fast, the working performance is stable, and the application rage is wider.

Description

technical field [0001] The invention relates to the field of integrated circuits, in particular to the technical field of integrated circuit chip testing, and specifically refers to a circuit structure and method for automatically testing analog baseband chips with analog-to-digital converters and digital-to-analog converters. Background technique [0002] Chip testing is an extremely important step in the chip research and development process, and the quality of the test scheme greatly affects the chip research and development cycle and research and development costs. A good test plan can improve the chip yield, shorten the R&D cycle, and reduce the R&D cost. In the development process of analog baseband chips including ADC and DAC, the stability of the test scheme, the reliability of the test results, and the test efficiency are all important factors affecting the development of the chip. [0003] The core of the mobile terminal includes radio frequency, analog baseband a...

AI Technical Summary

Problems solved by technology

[0012] (1) The test system is complex and the degree of automation is low;

[0013] (2) The measurable waveform is relatively simple;

[0014] (3) The analog output of the DAC is not easy to observe and count, thus affecting the calculation accuracy;

[0015] (4) Long test time and low efficiency

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