integrated circuit assembly method
An assembly method and integrated circuit technology, applied in the manufacturing of circuits, electrical components, semiconductor/solid-state devices, etc., can solve the problems of prolonging the product manufacturing cycle, increasing the difficulty, and destroying the bonding of various internal interfaces, so as to reduce the cost of personnel rework, Improve quality and reliability, reduce plating defects
Inactive Publication Date: 2011-12-28
郁丽华
View PDF0 Cites 2 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, this traditional packaging process has its disadvantages: on the one hand, the strength of the packaging resin will increase after plastic sealing and curing (PMC), which increases the difficulty of removing the flash in the post-process. If it is not clean, there will be exposed copper after electroplating, which will lead to the scrapping of the product
If the flash is not clean, it can be removed by manual rework, but it will cost a lot of manpower, increase the manufacturing cost, prolong the manufacturing cycle of the product, and may cause the possibility of artificially damaging the appearance of the product; On the one hand, during the post-curing (PMC) process after plastic sealing, due to the curing shrinkage stress of the packaging resin and the thermal shock of the post-curing temperature on the product, the stress between the internal interfaces will be increased to a certain extent or the internal interfaces will be damaged. The bonding between the internal interfaces, once there is a large stress between the internal interfaces or the bonding between the interfaces is damaged, it will aggravate the damage of the internal interfaces in the subsequent deburring process, especially during the electrolysis process, resulting in delamination between the interfaces Or the adhesive force is greatly reduced, thereby reducing the product's moisture absorption evaluation level and its reliability
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreExamples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0008] An integrated circuit assembly method, including the steps of plastic sealing, curing after plastic sealing, deflashing, and electroplating. Then it can be printed, cut ribs and formed according to the conventional process to obtain the product.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More
Abstract
The invention discloses a method for assembling an integrated circuit, which includes the steps of plastic sealing, curing after plastic sealing, deburring, and electroplating. The invention can maintain the original reliability of the packaging resin, and effectively and conveniently remove the defects on the surface and side of the lead frame during the plastic sealing process. The overflow, and can reduce the delamination of the internal interface, so that the product performance is reliable.
Description
Technical field: [0001] The invention relates to a method for assembling an integrated circuit. Background technique: [0002] At present, in all integrated circuit post-packaging industries in the world, the PMC process (post-curing process after plastic sealing) is placed after the plastic sealing process and before the deflashing plating process. Its purpose is to fully guarantee the integrity of the packaging resin itself Reliable performance, in order to effectively protect the function of the internal chip circuit. However, this traditional packaging process has its disadvantages: on the one hand, the strength of the packaging resin will increase after plastic sealing and curing (PMC), which increases the difficulty of removing the flash in the post-process. If it is not clean, there will be exposed copper after electroplating, which will lead to the scrapping of the product. If the flash is not clean, it can be removed by manual rework, but it will cost a lot of man...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/98H01L21/56
Inventor 郁丽华
Owner 郁丽华
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com