Microcontroller-based terahertz time-domain spectroscopy automatic sample testing device

Abstract

The invention discloses a microcontroller-based terahertz time-domain spectroscopy automatic sample testing device. The device comprises a terahertz sample testing device and a control system, wherein the terahertz sample testing device comprises a sample disk, a sample pool, a positioning hole, a stepping motor, a photoelectronic device, a testing platform, a terahertz testing hole, a leveling nut, a level instrument, a pressure spring fixation device, a pressure spring, a metal dome, a sample pool inner hole and a sample pool outer hole; and the control system comprises a microcontroller, a power supply circuit, a keypress circuit, a voice circuit, an alarm circuit, a liquid crystal display circuit, a light-emitting diode (LED) indicator circuit, a stepping motor driving circuit and a photoelectric positioning circuit. The reliability and a human engineering principle are fully considered, the experimental error is furthest reduced, the misoperation probability is reduced, and the experimental efficiency is improved.

Description

technical field [0001] The invention relates to a sample automatic testing device of a terahertz time-domain spectrum measurement system controlled by a microcontroller. Background technique [0002] Terahertz time-domain spectroscopy technology is a new technology that uses femtosecond lasers to excite gallium arsenide crystals to emit terahertz waves to detect substances. In the terahertz time-domain spectroscopy system, the acquisition of the terahertz time-domain waveform of the sample is measured by using a delay device by changing the optical path difference between the pump light and the probe light of the terahertz pulse electric field intensity passing through the sample at different moments . The main sources of error during the experiment are pump light, sample refraction and reflection, and human factors. The pump light will produce large amplitude and phase changes due to the fluctuation of ambient temperature and humidity. The refraction and reflection of the...

AI Technical Summary

Problems solved by technology

[0005] Although there are similar sample holder devices at present, it is difficult to guarantee the vertical accuracy of the sample relative to the terahertz light, and the initial position of the sample holder cannot be automatically adjusted after the sample is placed. There is no corresponding display device, and it is necessary to manually memorize the current position. No. of the sample pool, and no corresponding key input and other control circuits, it is very inconvenient to operate, and the test accuracy is difficult to guarantee

With the increase in the number of experiments and the number of samples put in, the use of existing devices can easily cause omission and confusion of sample testing steps, making it difficult to ensure the reliability of sample testing

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