The invention discloses a microcontroller-based terahertz time-domain spectroscopy automatic sample testing device. The device comprises a terahertz sample testing device and a control system, wherein the terahertz sample testing device comprises a sample disk, a sample pool, a positioning hole, a stepping motor, a photoelectronic device, a testing platform, a terahertz testing hole, a leveling nut, a level instrument, a pressure spring fixation device, a pressure spring, a metal dome, a sample pool inner hole and a sample pool outer hole; and the control system comprises a microcontroller, a power supply circuit, a keypress circuit, a voice circuit, an alarm circuit, a liquid crystal display circuit, a light-emitting diode (LED) indicator circuit, a stepping motor driving circuit and a photoelectric positioning circuit. The reliability and a human engineering principle are fully considered, the experimental error is furthest reduced, the misoperation probability is reduced, and the experimental efficiency is improved.