Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time

A real-time measurement, femtosecond laser technology, applied in the field of femtosecond laser pulses, which can solve problems such as limitations

Active Publication Date: 2012-01-11
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF4 Cites 25 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method requires optical polarizing elements
Since the polarizing optical element is only effective for a specific laser wavelength and has a certain spectral bandwidth, this limits the application of this method and instrument to a specific spectral range.
The dispersion of polarized optical components also limits the measurement of short pulses below 10fs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time
  • Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time
  • Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0054] see first figure 1 , the present invention self-reference spectrum interference femtosecond laser pulse real-time measurement method, comprises the following steps:

[0055] 1), using the third-order nonlinear optical effect to generate the first-order self-diffraction laser beam:

[0056] The laser beam 1 to be measured is divided into three laser beams by a beam splitting system, one of which has 5% of the total pulse energy for measurement, and is called the beam to be measured, and the other two laser beams have equal energy and are separated by a certain non-collinear clip. Focusing at an angle of 2° on a transparent nonlinear medium 12 produces a first-order self-diffraction beam, which is called a reference beam, and the light intensity I of the reference bea...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method and a device for measuring a self-referenced spectral interference femtosecond laser pulse in real time. In the method, firstly, laser is divided into three beams and two beams of laser are focused and irradiated on a non-linear transparent optimal medium to generate two beams of first-order self-diffraction light; any one beam of self-diffraction light is used as a reference laser pulse, the reference laser pulse is collinear with a third beam of laser pulse in space and is regulated to be coincident with the third beam of laser pulse, and a laser interference spectrum can be obtained by regulating delay time; and the interference spectrum is measured, so that a laser spectrum and a spectral phase can be obtained by inverse calculation through a self-referenced spectral coherence method, and thus, the width and the shape of the laser pulse can be measured. In the invention, an SRSI (self-referenced spectral interferometry) method and an FROG (frequency-resolved optical gating) method and the advantages thereof are combined; and the method and the device have the characteristics of high speed, simpleness and convenience and are suitable for singleshot measurement, real-time measurement and monitoring of the widths and the shapes of femtosecond laser pulses with different pulse widths and different wavelengths.

Description

technical field [0001] The invention relates to femtosecond laser pulses, in particular to a method and device for real-time measurement of femtosecond laser pulses (shape and width) by self-reference spectrum interference. The method is applicable to a femtosecond optical system with a pulse width of 10-300fs in the spectral range of 200-3000nm. The present invention is not only applicable to laser pulses with a megahertz repetition rate, but also applicable to the measurement of the pulse width and pulse shape of a single femtosecond laser pulse. Background technique [0002] With the development of femtosecond laser technology, femtosecond laser pulses are more and more widely used in various fields of society such as scientific research, processing, biology, medical treatment, national defense, and communication. In laboratory astrophysics, X-ray laser, laser electron and proton acceleration, attosecond laser pulse generation and other strong field laser physics, femtos...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 刘军李闯冷雨欣李儒新
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products