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System and method for testing bending fatigue reliability of low dimensional conducting material

A conductive material, bending fatigue technology, applied in the field of bending fatigue reliability test system, can solve the problems of large fatigue life measurement error of conductive film material, inability to accurately measure crack initiation life, fatigue and other problems, to achieve a wide range of fatigue test, measurement Precise, easy-to-prepare results

Inactive Publication Date: 2012-02-29
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide an accurate and simple test system and test method for the bending fatigue reliability of low-dimensional conductive materials such as micro-sized conductive films and wires. The test system and test method can characterize the fatigue and crack initiation of conductive film materials and extended life, to solve the problems existing in the prior art, such as the large error in the measurement of the fatigue life of conductive thin film materials, and the inability to accurately measure the initiation life of cracks, etc.

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  • System and method for testing bending fatigue reliability of low dimensional conducting material
  • System and method for testing bending fatigue reliability of low dimensional conducting material
  • System and method for testing bending fatigue reliability of low dimensional conducting material

Examples

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Embodiment 1

[0063] The metal nickel foil with a thickness of 50μm is mechanically polished and electrolytically polished, the thickness of the tested conductive sample 5 is 34μm, and it is cut into a U-shaped small-scale tested conductive sample 5-1, and the sample is fixed on On the sample holder 6, the effective length of the cantilever beam is selected as 3mm, and the assembly diagram of the sample and the sample holder 6 device is shown in Figure 2. Before the fatigue test, the uniaxial tensile test was used to obtain the tensile stress-strain curve of the nickel foil to obtain the constitutive relationship in the finite element simulation. Using the constitutive relationship, the maximum strain at the root of the sample was calculated to be 1.0921%. A sine wave with a frequency of 50 Hz is selected as the loading fatigue waveform, the sample amplitude is 2 mm, and the tension-compression symmetric fatigue loading is adopted. From the real-time resistance value of the sample measured d...

Embodiment 2

[0065] The drawn pure copper wire with a diameter of 25μm is bent into an arc, and its two ends are fixed on the clamp 6. The length of the filament cantilever is selected to be 3.5mm, as shown in the assembly drawing Figure 4 Shown. Before the fatigue test, the tensile stress-strain curve of the copper wire was obtained by the uniaxial tensile test to obtain the constitutive relationship in the finite element simulation. The maximum strain at the root of the sample was calculated by using the constitutive relationship to be 8.5%. A sine wave with a frequency of 50 Hz is selected as the loading fatigue waveform, the amplitude of the sample is 2 mm, and the tension-compression symmetrical fatigue loading is adopted. A multi-channel digital multimeter was used to collect the resistance value of the sample during the fatigue experiment. From the real-time resistance value of the sample measured during the fatigue experiment, the relative change rate of the sample resistance is ca...

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Abstract

The invention relates to the establishment of a system and method for testing the bending fatigue reliability of a low dimensional conducting material, in particular to a system and method for testing the bending fatigue reliability of a low dimensional conducting material. The problems that the fatigue life measurement error of the conducting film material is great, the crack initiation life can not be accurately measured and the like existing in the prior art are solved. The test system comprises an electromagnetic driving part, a fatigue loading and measurement part and a detection and recording part. The system provides a function and test method for testing the dynamic bending fatigue properties of various materials, and meanwhile, the resistance variation of tested samples can be monitored, analyzed and recorded in real time. The information such as fatigue life, crack initiation and propagation life and the like of various tested conducting samples can be accurately obtained through the recorded resistances. By using the system, the fatigue property experiment can be carried out on various tested conducting samples simultaneously, the resistance value of each tested conducting sample can be recorded and analyzed in real time, and the experiment is simple and quick to operate.

Description

Technical field [0001] The invention relates to the establishment of a fatigue performance test system and a test method for low-dimensional conductive materials, in particular to a test system for the bending fatigue reliability of low-dimensional conductive materials, and the acquisition of crack initiation and propagation information in a tested sample and Test method for fatigue life of materials. Background technique [0002] Low-dimensional conductive film materials have a wide range of applications in today's electronic information, industrial and medical fields, such as microelectronic trigger switches in micro / nano electromechanical systems (MEMS / NEMS), and various materials for cardiovascular stents. The above-mentioned devices are subjected to complex alternating fatigue loads such as reciprocating bending, stretching or torsion during actual service. Understanding the fatigue properties of the conductive film materials in the device is of great help to its design and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/60G01N3/20
Inventor 张广平徐进张滨宋竹满
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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