Method for realizing rapid modulation degree profilometry by use of two orthogonal sinusoidal gratings

An orthogonal sine and orthogonal grating technology, applied in the field of optical 3D sensing, can solve problems such as slow measurement speed, and achieve real-time 3D reconstruction and good application prospects.

Inactive Publication Date: 2012-06-27
SICHUAN UNIV
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Problems solved by technology

[0003] The object of the present invention is to aim at the defect of slow measurement speed of modulation degree measurement profilometry, and propose a method for fas

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  • Method for realizing rapid modulation degree profilometry by use of two orthogonal sinusoidal gratings
  • Method for realizing rapid modulation degree profilometry by use of two orthogonal sinusoidal gratings
  • Method for realizing rapid modulation degree profilometry by use of two orthogonal sinusoidal gratings

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[0021] The present invention will be described in further detail below in conjunction with the accompanying drawings, working principles and embodiments.

[0022] The principle diagram of the present invention is as figure 1 As shown, 1 is the projection light source, 2 is the vertical grating, 3 is the horizontal grating, 4 is the projection lens, 5 is the projected image plane of the vertical grating, 6 is the measured object, 7 is the projected image plane of the horizontal grating, 8 is the reference plane. Under geometric optics approximation, a sinusoidal grating is placed on the position of the object plane of the projection lens, considering the ideal imaging situation, what is obtained on the image plane after imaging by the projection lens is still a sinusoidal grating, and in the present invention, two gratings are used, Since the projection light source is an incoherent light source, and the two gratings are separated by a certain distance, it can be approximated ...

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Abstract

The invention discloses a method for realizing rapid modulation degree profilometry by use of two orthogonal sinusoidal gratings at a certain interval in the optical three-dimensional sensing technology. In the method, two orthogonal sinusoidal gratings at a certain interval are imaged on a measured object at the same time, and the measured object is located between the imaging surfaces of the two gratings; and a CCD (charge coupled device) camera obtains the object surface image modulated by the orthogonal gratings through a semi-transparent semi-reflecting mirror from the same direction. The images of the orthogonal gratings are separated by Fourier transform, spatial frequency-domain filtration and inverse Fourier transform so as to obtain the modulation degree distribution of the images of the two gratings on the object surface; and the object height is recovered according to the pre-calibrated corresponding relationship between the modulation degree ratio and height. In the method, the projection direction of the gratings is coaxial with the imaging direction of the CCD camera, and the method has the characteristic of vertical measurement. The method can recover the object height by acquiring only one image, and has the characteristic of real-time acquisition of three-dimensional information.

Description

technical field [0001] The invention relates to optical three-dimensional sensing technology, in particular to a method for realizing fast modulation degree measurement profilometry by using two orthogonal sinusoidal gratings separated by a certain distance. Background technique [0002] Three-dimensional object surface profile measurement, that is, three-dimensional surface measurement, is of great significance in the fields of machine vision, biomedicine, industrial inspection, rapid prototyping, film and television special effects, product quality control, etc. Optical three-dimensional sensing technology has been greatly developed due to its advantages of non-contact, high precision, and easy automatic control. Existing optical three-dimensional sensing methods mainly include: triangulation, Moiré Topography (MT for short), Fourier Transform Profilometry (FTP for short), and spatial phase detection (Spatial Phase Detection). , SPD for short), Phase Measuring Profilometr...

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Application Information

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IPC IPC(8): G01B11/25
Inventor 苏显渝窦蕴甫向立群曹益平张启灿刘元坤陈文静
Owner SICHUAN UNIV
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