Software fault-tolerant method capable of comprehensively on-line self-detection single event upset

A single-event flipping, software fault-tolerant technology, applied in the generation of response errors, instruments, electrical and digital data processing, etc., to save hardware costs and time costs, improve efficiency, and count the number of single-event flips in a comprehensive manner.

Active Publication Date: 2012-06-27
XIAN INSTITUE OF SPACE RADIO TECH
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Problems solved by technology

[0012] At present, there is no software fault-tolerant method that uses DMA method, adopts pure software design, and uses fault-tolerant processin

Method used

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  • Software fault-tolerant method capable of comprehensively on-line self-detection single event upset
  • Software fault-tolerant method capable of comprehensively on-line self-detection single event upset
  • Software fault-tolerant method capable of comprehensively on-line self-detection single event upset

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Embodiment Construction

[0064] The following is a specific implementation description by using more DSP 6X series processors.

[0065] 1. Perform memory address link configuration

[0066] After the DSP processor chip is reset, according to the memory mapping relationship, the ROM loading mode is adopted to move all the codes in the ROM space to the address of the program memory space through the processor chip. As shown in the accompanying drawings figure 1 shown.

[0067] The corresponding situation of the load address segment: ROM_B area places the program code including all application programs, and the program code of the fault-tolerant processing parameter generation module and the fault-tolerant processing A module. When the program is running, it is loaded in the corresponding program memory RAM_B area; The program code of the B module is loaded into the corresponding program memory RAM_A area when the program is running, and the ROM_B area and ROM_A area are determined according to the siz...

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Abstract

A software fault-tolerant method capable of comprehensively on-line self-detection single event upset comprises the steps of executing storage address interlinking configuration, a fault-tolerant processing parameter generation module, a fault-tolerant processing A module and a fault-tolerant processing B module, reading program storage data in direct memory access (DMA) subsection mode, dynamically generating fault-tolerant processing parameters through verification algorithm and conducting redundancy storage. The fault-tolerant processing B module is used for autonomously and timely monitoring application programs and operation of the fault-tolerant processing A module which is used for timely monitoring operation of the fault-tolerant processing B module, once the single event upset of the programs occurs, corresponding code segment is loaded from a read only memory (ROM), a purpose of conducting error correction of application program codes is achieved, the whole realization process is carried out in a DMA mode, no central processing unit (CPU) time is occupied, the programs is guaranteed to timely operate while conducting error correction, and reliability and safety of on-track operation of software is improved, simultaneously a large amount of hardware cost and time cost are saved, and efficiency is improved.

Description

technical field [0001] The invention relates to a software fault-tolerant method capable of comprehensive online self-detection of single-event reversal, which is used for error detection and correction of single-event reversal in space applications or other errors caused by program code errors. Background technique [0002] There are currently two main ways to design against single event upsets. One is to use hardware design software to cooperate with EDAC error detection and correction for applications, or the software directly runs on high-level devices that are almost immune to single event upsets. The second is not to rely on In terms of hardware design, a pure software design method is used to detect and correct errors for single event flips in the application program. [0003] In recent years, we have learned from public publications and public channels that the design of anti-single event upset event protection based on memory RAM at home and abroad is as follows: ...

Claims

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Application Information

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IPC IPC(8): G06F11/07G06F13/28
Inventor 吴国春吴化军陶晓霞徐丽娜钟兴旺王一唯林梦园
Owner XIAN INSTITUE OF SPACE RADIO TECH
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