Inspection system and inspection method
A detection system and detection method technology, which can be used in diode testing, single semiconductor device testing, semiconductor working life testing, etc., and can solve problems such as production process and cost increase
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no. 1 example
[0065] figure 1 It is a schematic diagram of the electrical connection of the detection system of the first embodiment of the present invention, figure 2 for figure 1 The voltage application device and the current detection device shown are the relationship diagrams of the output voltage of the light-emitting element and the measured current versus time, and Figure 3A and Figure 3B respectively to use figure 1 The voltage and current curves of the detection system for detecting the quality of the grains are shown. Please refer to figure 1 , the detection system 100 disclosed in this embodiment can judge the quality of at least one light-emitting element 101 in a short time (for example, within a few minutes), thereby reducing the production cost and time of the product. For example, a 1,000-hour continuous spot test is usually carried out in the way of testing the quality of the grains of light-emitting elements. If the grains can still maintain a certain luminance aft...
no. 2 example
[0087] Figure 5 It is a schematic diagram of the electrical connection of the detection system of the second embodiment of the present invention, Figure 6A for Figure 5 The current application device and the voltage detection device are shown as the relationship between the output current of the light-emitting element and the measured voltage versus time, and Figure 7 for use Figure 5 The voltage and current curves of the detection system for detecting the quality of the grains are shown. Please refer to Figure 5 The detection system 200 disclosed in this embodiment can also judge the quality of the crystal grains of at least one light-emitting element 101 in a short period of time (eg, within a few minutes), thereby reducing production costs and time.
[0088] This embodiment proposes a detection system 200 that can quickly detect the quality of the crystal grains of the light-emitting element 101, which includes a current applying device 210, a voltage detection de...
no. 3 example
[0103] Figure 8 is a schematic diagram of the electrical connection of the detection system of the third embodiment of the present invention, and Figure 9 for use Figure 8 The voltage and current curves of the detection system for detecting the quality of the grains are shown. Please refer to Figure 8 The inspection system 300 disclosed in this embodiment can also judge the quality of the crystal grains of at least one light-emitting element 101 in a short time (for example, within a few minutes), thereby reducing the production cost and time of the product.
[0104] This embodiment proposes a detection system 300 capable of quickly detecting the quality of the crystal grains of the light-emitting element 101 , which includes a pulse current applying device 310 , a voltage detection device 320 and a control unit 330 . The pulse current applying device 310 is electrically connected to the light-emitting element 101 , and applies a pre-detection pulse current and a fast-d...
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