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Thin flat plate structure resonance modal analysis system and using method thereof

A resonance mode and analysis system technology, applied in the direction of using optical devices, using wave/particle radiation, measuring devices, etc., can solve the modal analysis of objects that do not form a modal analysis speckle interferometry system and do not explain the thin plate structure , Quickly measure the resonant frequency of each order of the measured object, etc., to achieve the effect of reducing data processing time, good economic benefits, and online rapid measurement

Inactive Publication Date: 2014-08-20
TIANJIN UNIV
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Problems solved by technology

Shenyang Engine Design Institute used ESPI technology to measure the vibration deformation of engine blades. Although these studies obtained the vibration fringe distribution at a certain fixed frequency, they did not explain how to quickly measure the resonant frequencies of each order of the measured object, and each The corresponding vibration shape distribution at the first resonance frequency
[0007] To sum up, the current vibration measurement method using speckle is to measure the deformation of the object at a certain vibration frequency, and it does not explain how to use electronic speckle interferometry technology to perform modal analysis on thin plate structure objects, nor has it formed A Speckle Interferometry System Specially Used for Modal Analysis
Therefore, the use of electronic speckle interferometry technology to quickly measure the resonance frequency and resonance mode of different thin plates, especially to determine the resonance order and resonance frequency of the tested plate by identifying different fringe images, is currently not available in China. A complete set of theories and systems, and no patent for modal analysis of thin plates using electronic speckle interferometry

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  • Thin flat plate structure resonance modal analysis system and using method thereof
  • Thin flat plate structure resonance modal analysis system and using method thereof
  • Thin flat plate structure resonance modal analysis system and using method thereof

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Embodiment Construction

[0038] The thin plate structure resonance mode analysis system of the present invention will be described in detail below with reference to the embodiments and the accompanying drawings.

[0039] The thin plate structure resonance mode analysis system of the present invention includes a laser light source 1, which is located at the light output side of the laser light source 1 and divides the light into an object beam and a reference beam. The first beam splitting prism 2 is located at the first beam splitting prism 2 The first spatial light filter 4 on one side of the object beam, the second spatial light filter 5 on one side of the reference beam of the first beam splitting prism 2, and the outgoing light side of the first spatial light filter 4 is set to receive The measured flat plate 7 of light, the light-emitting side of the second spatial light filter 5 is provided with a reference plane 6 for receiving light, and a second branch for respectively receiving the light refl...

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Abstract

Disclosed are a thin flat plate structure resonance modal analysis system and a using method thereof. The system comprises a first beam splitter prism, a first space light filter, a second space light filter, a second beam splitter prism, an optical signal camera, a PC (personal computer) and a frequency-tunable sine wave generator, the first beam splitter prism is positioned on a laser outlet side of a laser light source, the first space light filter is positioned on one side of an object beam of the first beam splitter prism, the second space light filter is positioned on one side of a reference beam of the first beam splitter prism, a detected flat plate for receiving light is arranged on a light emergent side of the first space light filter, a reference plane for receiving light is arranged on a light emergent side of the second space light filter, an image acquisition card which is used for receiving images acquired by the camera is embedded in the PC, and an output end of the frequency-tunable sine wave generator is connected to a shock excitation source for performing shock excitation for the detected flat plate. The system can precisely detect micrometer resonance deformation. Coordinate values of the most severely deforming position of the thin flat plate and the deformation maximum value can be solved one by one by a later-stage image processing method.

Description

technical field [0001] The present invention relates to a resonance mode analysis. In particular, it relates to a thin plate structure resonance mode analysis system and its application method. Background technique [0002] Electronic speckle interferometry technology is a high-precision, high-sensitivity, real-time detection optical measurement technology. Since the electronic speckle interferometry technology is an optical measurement technology based on the small deformation of the three-dimensional object surface to generate interference fringes, it is widely used in the deformation analysis of materials in the detection industry, deformation, vibration shock, roughness caused by vibration in mechanical engineering degree etc. measurement. [0003] The resonance modal analysis of flat plate structure is very important in the application of mechanical engineering, and it is widely used in aerospace industry and electronic industry. In order to measure various materials...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16G01H9/00
Inventor 贾大功季业张红霞刘铁根张以谟
Owner TIANJIN UNIV
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