Dual-network-interface-card switching performance testing method for information integration system

Abstract

The invention discloses a dual-network-interface-card switching performance testing method for an information integration system. The method includes: firstly, connecting equipment under test and a network tester to a network switch of the information integration system; secondly, logging in the network switch, running the network tester for ARP (address resolution protocol) message transmission and message capturing, and alternately opening/closing corresponding ports of the switch; and finally, processing captured data message so that switching time is obtained. By the aid of the method, the defects due to manual plugging and unplugging of network connection cables traditionally are avoided, working efficiency is improved, equipment failure rate is decreased, test period is shortened, and manpower and material resources are reduced. Technically, the method is simple and clear in principle, process control is extremely simple, and work quality of dual-network-interface-card switching tests can be well guaranteed.

Description

technical field [0001] The invention belongs to the application field of local area network communication, and in particular relates to a dual-network card switching function and performance test method, which is suitable for the dual-network card switching test under a system adopting a double-redundant Ethernet structure and a double-network card design. [0002] Background technique [0003] With the development of high technology, in order to improve the reliability of the system, in order to ensure that the whole system will not be paralyzed in case of partial failure or damage, the information integration system widely adopts the distributed dual redundant Ethernet structure, and the single network equipment A dual redundant network card design is also carried out. Such as figure 1 As shown in the figure, switch A and switch B are connected to each other, and they work at the same time and are mutually redundant. Each node uses dual cards a and b to interconnect wit...

AI Technical Summary

Problems solved by technology

[0006] There are many disadvantages in this method. First, the switching time is affected by human factors.

When different testers alternately plug and unplug dual network cables, the test results will be different, and even the results will be very different. This is the so-called plugging method factor; It is carried out during power-on operation, and plugging and unplugging ports with power on is likely to cause some hardware failures, such as network card failures

At the same time, the test is generally repeated many times, which is a test for the connector. With the increase in the number of plugging and unplugging, the contact performance of the connector will inevitably decrease; again, affected by the location factor, the tester must carry the test equipm

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