Cutting method for MEMS wafer
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- MEMSIC SEMICON WUXI
- Publication Date
- 2013-01-30
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The present invention relates to a cutting method of a semiconductor wafer, in particular to a cutting method of a MEMS (Micro-Electro-Mechanical Systems, Micro-Electro-Mechanical Systems) wafer. Background technique
[0002] At present, the cutting methods of MEMS wafers mainly include backside water jet half-cutting and splitting process, and laser process. As we all know, MEMS devices are extremely sensitive to particles, and the particles generated in the cutting process will affect the reliability of the device, and even cause device failure in severe cases. As far as the backside waterjet half-cutting and splitting process is concerned, although it can protect MEMS devices from being contaminated by cutting water containing silicon powder during the cutting process, the subsequent splitting process will produce uneven split profiles and uneven cracks. On the positive side, in severe cases, it will cause damage to the inside of the chip; at the s...