Method and device for detecting clamping performance between vacuum electron device pipe casings and helical line

Abstract

The invention discloses a method for detecting clamping performance between vacuum electron device pipe casings and a helical line. The method comprises a first step of arranging an optical fiber sensor in the helical line, and enabling an optical fiber line to be connected with a demodulator; a second step of fixing a temperature sensor; a third step of enabling the temperature sensor, the demodulator, a personal computer (PC), the helical line and a main controlling machine to be connected; a fourth step of obtaining a mean temperature difference curve S<0> of N vacuum electron devices good in clamping performance; a fifth step of obtaining a temperature difference curve Q of to-be-measured vacuum electron devices; and a sixth step of judging the clamping performance between pipe casings of the to-be-measured vacuum electron devices and the helical line. A device for implementing the method comprises the PC, the demodulator, the main controlling machine, a beam and a detection unit. The detection unit comprises the vacuum electron device pipe casings, the optical fiber sensor and the temperature sensor. By utilizing the method and the device, measurement of the clamping performance of a designated position can be achieved on the premises that the vacuum electron devices are not damaged.

Description

technical field [0001] The invention belongs to the fields of optical fiber sensing and industrial measurement and control, and specifically relates to a method and a device for detecting the clamping property between a vacuum electronic device shell and a helix. Background technique [0002] Vacuum vacuum electronic devices are the core components of spaceborne transponders and spaceborne synthetic aperture radar transmitters, so they are known as the "heart" of satellite communication systems. With the rapid development of satellite communications, vacuum vacuum electronic devices have been more and more widely used, and higher and higher requirements are put forward for their reliability and lifespan. The high-reliability and long-life design of vacuum vacuum electronic devices is a technical problem concerned by the whole world. It is directly related to the stability and service life of the entire satellite communication system, and the reliability and life of vacuum va...

AI Technical Summary

Problems solved by technology

The slow-wave structure mainly conducts heat outward in the form of conduction. These losses cause a large heat flow rate in this part, which leads to an increase in the temperature of the slow-wave structure, which seriously affects the stability and reliability of the slow-wave structure and restricts its output power. transmission, when the heat loss is too large, it will even burn the helix

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