Method for extracting pose measurement feature points based on target feature modeling

A technology of feature point extraction and pose measurement, which is applied in image data processing, instruments, calculations, etc., can solve the problems of starry sky background interference, energy consumption of optical feature points, etc., and achieve the goals of avoiding image processing, stable results, and good application prospects Effect

Inactive Publication Date: 2013-02-06
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

[0005] The purpose of the present invention is to solve the interference problem caused by the background of the starry sky and the energy consumption problem of the optical fe...

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  • Method for extracting pose measurement feature points based on target feature modeling
  • Method for extracting pose measurement feature points based on target feature modeling
  • Method for extracting pose measurement feature points based on target feature modeling

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[0026] In order to better illustrate the purpose and advantages of the present invention, the technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0027] In order to simulate the process of spacecraft rendezvous and docking, the mission board is used to simulate the target spacecraft, and 12V / 3W LED lights are installed on the mission board as optical feature points. The mission board is installed on the three-axis turntable, and the camera is fixed on the tripod. Simulate the vision system of tracking spacecraft, the relative movement between two spacecraft is realized by the movement of three-axis turntable.

[0028] Design task board LED light configuration, such as figure 1 As shown, LED lights are installed in holes 6, 7, 8, and 9 to form a rhombus, and its coordinates relative to the task board are [200, 70], [120, 150], [200, 230], [280, 150] (in order of task The upper left corner...

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Abstract

The invention relates to a method for extracting pose measurement feature points based on target feature modeling, in particular to a method for extracting feature points under complex celestial background on the basis of target feature modeling and belongs to the technical field of rendezvous and docking. The method includes: firstly, setting four low-consumption light emitting diodes forming a diamond on a target spacecraft; using a spacecraft trace camera to acquire optical feature point images under the complex celestial background in the approach stage of rendezvous and docking of the spacecraft, and performing adaptive threshold binarization and smooth filtering to obtain a binary image; and searching planar diamond structures in the image to obtain image plane coordinates of the spacecraft optical feature points. Interference of the celestial background can be eliminated effectively, random noise can be eliminated, optical plane coordinates of the optical feature points can be obtained easily, results are stable and reliable, and the method is easy to implement.

Description

technical field [0001] The invention relates to a feature point extraction method for pose measurement based on a target feature configuration, in particular to a feature point extraction method based on a target feature configuration in a complex starry sky background, and belongs to the technical field of rendezvous and docking. Background technique [0002] With the development of satellite technology, in the space rendezvous and docking mission of spacecraft, it is necessary to accurately measure the relative position and relative attitude between two spacecraft. Usually, the optical feature points are set on the target spacecraft, and the CCD sensor is installed on the tracking spacecraft. According to the geometric shape, size and position of the optical feature points, the small hole imaging principle is used to make the CCD sensor image. Through the calculation of imaging and analysis to determine the relative position and relative attitude between two spacecraft. T...

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Application Information

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IPC IPC(8): G06T7/00
Inventor 张景瑞温凯翟光
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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