Method and system for measuring emissivity of high-temperature material

A technology of high-temperature materials and measurement methods, applied in measurement devices, analysis materials, material analysis by optical means, etc., can solve problems such as large measurement errors and difficulty in ensuring the synchronization of two measurements, so as to reduce error sources and improve measurement. Accuracy and convenience of testing, the effect of ensuring simultaneity

Active Publication Date: 2013-02-13
BEIJING ZHENXING METROLOGY & TEST INST
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Problems solved by technology

It is difficult to ensure the synchronization of the two measurements by using the energy comparison method of standard...

Method used

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  • Method and system for measuring emissivity of high-temperature material
  • Method and system for measuring emissivity of high-temperature material

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Embodiment Construction

[0029] Below in conjunction with accompanying drawing, preferred embodiment of the present invention will be further described:

[0030] figure 1 Shown is the high-temperature emissivity imaging spectrum measurement flow chart of the material. The whole testing process can be divided into the following steps:

[0031] Step 1, processing a blackbody cavity on the sample to be tested. First, the sample to be tested is processed into a cylindrical shape, and a hole is opened on one side of the cylinder. The geometric size of the hole meets the condition of forming a black body cavity effect.

[0032] Step 2, rotate the sample in a vacuum environment. Place the sample to be tested vertically in the vacuum chamber and fix it, with one end of the opening facing upwards, so that the sample to be tested is kept rotating at a constant speed in the horizontal plane during the test.

[0033] Step 3, radiative heating of the sample. Radiation energy is used to irradiate the measured ...

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Abstract

The invention provides a method and system for measuring emissivity of a high-temperature material, wherein the system comprises a large-power radiation source, a beam expanding, reshaping and homogenizing device, a vacuum chamber, a sample test platform, a rotating planar reflector, a micro-imaging device, a light spectrum switching device, a radiation energy imaging measuring device, and a temperature measuring device. According to the method and the system provided by the invention, a blackbody cavity is machined out on a tested sample; an imaging method is used to simultaneously measure a radiation energy of a tested material surface and the blackbody cavity; a narrow band filter is employed for performing light spectrum selection, so that not only can a tested material and a standard reference sample be simultaneously measured, but also the sample and a reference source can be guaranteed to be completely isothermal, and therefore, an error resource of emissivity measurement can be remarkably reduced, measurement accuracy and test convenience can be improved, and engineering application is facilitated.

Description

technical field [0001] The invention belongs to the technical field of material thermophysical parameter measurement, and more specifically relates to a method for measuring the emissivity of materials at high temperatures by using an energy comparison method. Background technique [0002] At present, in the field of emissivity research of high-temperature materials, the method of high-current heating is mostly used, which is not suitable for the measurement of emissivity of materials with poor conductivity such as composite materials and high-temperature ceramics, and the upper limit of temperature measurement is difficult to ensure a good temperature on the surface of the sample. Field uniformity while reaching temperatures above 2000K. In the measurement method, the calorimetric method of measuring absolute energy, the energy comparison method of switching measurement between the standard reference black body and the measured sample, etc. are used. There are many sources...

Claims

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Application Information

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IPC IPC(8): G01N21/00
Inventor 张虎孙红胜陈应航王加朋任小婉宋春晖李世伟
Owner BEIJING ZHENXING METROLOGY & TEST INST
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