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Interior charging and discharging characteristic stimulation test system and method of high-power part

A technology for simulating test systems and charging and discharging characteristics, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems of no reasonable and effective systems and methods, and achieve the effect of reducing scattering problems and suppressing overflow

Inactive Publication Date: 2013-03-20
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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  • Abstract
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  • Application Information

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Problems solved by technology

At present, the simulation test of ground charge and discharge characteristics of high-power components is still in its infancy, and there is no corresponding reasonable and effective system and method

Method used

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  • Interior charging and discharging characteristic stimulation test system and method of high-power part
  • Interior charging and discharging characteristic stimulation test system and method of high-power part
  • Interior charging and discharging characteristic stimulation test system and method of high-power part

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Embodiment

[0035] like figure 1 The shown high-power components internal charging and discharging characteristics simulation test system, the system includes an electron accelerator 1, a vacuum pumping group 10, a vacuum target chamber 2, a test chamber 17, and a space between the vacuum target chamber 2 and the test chamber 17. A current loop 13; a sample stage 14, an insulating support 16, a non-contact potentiometer probe 11, and a Faraday cup 12 are arranged in the vacuum target chamber 2; an electron accelerator control system 3 and a non-contact potentiometer are arranged in the test chamber 17 4. Beam monitor 5, oscilloscope 6, drive mechanism 7, electronic load 8, vacuum gauge 9; their relative positions and connections are as follows:

[0036] The electron accelerator 1 is located above the vacuum target chamber 2;

[0037] Inside the vacuum target chamber 2, the sample stage 14 is fixed on the bottom surface of the vacuum target chamber 2, an insulating support 16 is installed...

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Abstract

The invention relates to an interior charging and discharging characteristic stimulation test system and method of a high-power part and belongs to the technical field of space testing. The interior charging and discharging characteristic stimulation test system comprises an electronic accelerator, a vacuum air exhausting group, a vacuum target chamber, a testing chamber and an electric current loop arranged between the vacuum target chamber and the testing chamber, wherein a sample table, an insulating support, a non-contactable potentiometer probe and a faraday cup are arranged in the vacuum target chamber; and an electronic accelerator control system, the non-contactable potentiometer probe, a beam monitoring instrument, an oscillometer, a driving mechanism, an electronic load and a vacuum gauge are arranged in the testing chamber. High-power part samples are filled in the interior charging and discharging characteristic stimulation test system through high-energy electrons, the oscillator is opened for monitoring discharging signals in the samples, and potential on the surfaces of the samples can be tested through the non-contactable potentiometer probe. The interior charging and discharging characteristic stimulation test method measures medium charging potential in a sensing method, and the charging and discharging effect of materials cannot be influenced.

Description

technical field [0001] The invention relates to a simulation test system and method for internal charging and discharging characteristics of high-power components, belonging to the technical field of space testing. Background technique [0002] High-power components are electrical components with large input and output power in the satellite's internal power supply system, such as satellite solar array drive mechanism (SADA), satellite power supply, and solar array. [0003] For various high-voltage and high-power components used in satellites, ground simulation tests for deep charging effect evaluation are required. The so-called deep charging effect is mainly caused by high-energy electrons in the outer radiation belt (3-7Re), and is the main cause of failure and abnormality of medium and high orbit (MEO and GEO) satellites. The energy of these high-energy electrons is mainly in the range of 0.1-10MeV, and has a strong penetrating ability, which can penetrate the surface ...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 柳青李得天陈益峰秦晓刚汤道坦王俊史亮孔风连
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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