Measuring device for femtosecond laser pulse shapes

Abstract

A measuring device for femtosecond laser pulse shapes structurally comprises a four-small pore plate, a medium delay piece, a reflector with partial area coated, a paraboloid reflector, a third-order nonlinear medium piece, a small-hole aperture, a focusing lens, a concave reflector and a high resolution spectrograph. And an output end of the high resolution spectrograph is connected with an input end of a computer. The measuring device for femtosecond laser pulse shapes has the advantages of simple and practical structure, convenience for adjusting, quickness in data collection and data processing and suitability for measuring and real-time monitoring of pulse widths and pulse shapes of femtosecond lasers of different pulse widths and wavelengths.

Description

technical field [0001] The invention relates to femtosecond laser pulse measurement, in particular to a measuring device for femtosecond laser pulse shape. Background technique [0002] With the expansion and in-depth application of femtosecond laser pulses in scientific research, biology, medical treatment, processing, communication, national defense and other social fields. The research of femtosecond laser and corresponding femtosecond laser technology has also developed rapidly. The pulse shape and pulse width of a femtosecond laser are important optical parameters in the application of femtosecond laser pulses, and its measurement or real-time monitoring is necessary in many experiments and applications. Therefore, a simple, practical and adjustable device for laser pulse width measurement and real-time monitoring is very important to promote the application of femtosecond lasers. [0003] Recently, one based on cross-polarized wave (XPW) [see Reference 1: A. Jull...

AI Technical Summary

Problems solved by technology

However, this method requires optical polarizing elements

Since the polarization optical element is only effective for a specific laser wavelength and has a certain spectral bandwidth, this limits the application of this method to a specific spectral range.

The dispersion of polarized optical components also limits the measurement of short pulses below 10fs

We also recently proposed an SRSI method based on the self-diffraction effect, which is not limited by dispersion, but the structure of this method is somewhat complicated [see literature 3: J. Liu, Y.L. Jiang, T. Kobayashi, R. X. Li, and Z. Z. Xu, “Self-referenced spectral interferometry based on self-diffraction effect,” J. Opt. Soc. Am. B 29(1):29-34(2012)]

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