Accelerated PID (Potential Induced Degradation) testing method

A test method and component technology, applied in the monitoring of photovoltaic systems, single semiconductor device testing, photovoltaic power generation and other directions, can solve the waste of resources such as manpower in the environmental test chamber, which is not conducive to shortening the experimental period, and the testing time is long. The effect of reducing PID test time, shortening experimental period and improving test conditions

Inactive Publication Date: 2013-04-03
ALTUSVIA ENERGY TAICANG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the PID test of solar panels, the method currently used in the industry is usually carried out under high humidity, using the water film on the surface of the module to conduct electricity to form an equipotential surface on the surface of the module. However, due

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0017] A kind of accelerated PID testing method, concrete steps are as follows:

[0018] (1) Clean the surface of the component to remove dust and other particles on the surface of the component;

[0019] (2) Sprinkle a small amount of water on the surface of the component, and wipe the water evenly with a dust-free cloth;

[0020] (3) Cover the surface of the module with aluminum foil to remove air bubbles between the aluminum foil and the module to ensure good contact between the aluminum foil and the module. To ensure good contact between the module and the aluminum foil, the thickness of the aluminum foil is 150 μm;

[0021] (4) Move the components into the environmental test box, short-circuit the positive and negative poles of the components, and lead the wires from the aluminum foil and the component terminals to the outside of the environmental test box, and raise the temperature of the components through the environmental test box to obtain a larger leakage. current,...

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PUM

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Abstract

The invention provides an accelerated PID (Potential Induced Degradation) testing method comprising the following steps of: (1) cleaning a surface of an assembly; (2) scattering a less amount of liquid on the surface of the assembly; (3) covering a conductive thin film on the surface of the assembly, so that good contact of the conductive thin film and the assembly can be ensured; (4) putting the assembly in an environment test box, enabling the anode and cathode of the assembly to be shorted-circuited, leading out wires from the conductive thin film and the wiring end of the assembly from the environment test box, and heating the assembly to a temperature which is more than 60 DEG C through the environment test box; and (5) grounding the conductive thin film, supplying a negative voltage which is more than minus 600 V on the wiring end of the assembly, and then carrying out a PID test. By utilizing the accelerated PID testing method provided by the invention, the PID testing time is greatly reduced from some days to some hours by improving testing conditions; the test period is reduced; and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of crystalline silicon solar cells, in particular to a method for testing the reliability of solar cell components. Background technique [0002] In a photovoltaic system, for safety reasons, the aluminum frame of the module is usually grounded, so that the battery terminal will be in a state of negative pressure. Driven by this negative pressure, the current flows from the ground terminal to the battery through the aluminum frame, glass and EVA. During this process, a large amount of positive charges will accumulate on the surface of the battery, causing the battery to fail. This is the attenuation of components under high voltage ( potential induced degradation), referred to as PID. With the development of photovoltaic technology, the number of panels connected in series in large-scale photovoltaic systems is increasing. Under working conditions, some components will be in a high voltage state, usually reaching 600...

Claims

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Application Information

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IPC IPC(8): G01R31/26H02S50/10
CPCY02E10/50
Inventor 任常瑞夏正月许小明张斌邢国强
Owner ALTUSVIA ENERGY TAICANG
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