Accelerated PID (Potential Induced Degradation) testing method

Abstract

The invention provides an accelerated PID (Potential Induced Degradation) testing method comprising the following steps of: (1) cleaning a surface of an assembly; (2) scattering a less amount of liquid on the surface of the assembly; (3) covering a conductive thin film on the surface of the assembly, so that good contact of the conductive thin film and the assembly can be ensured; (4) putting the assembly in an environment test box, enabling the anode and cathode of the assembly to be shorted-circuited, leading out wires from the conductive thin film and the wiring end of the assembly from the environment test box, and heating the assembly to a temperature which is more than 60 DEG C through the environment test box; and (5) grounding the conductive thin film, supplying a negative voltage which is more than minus 600 V on the wiring end of the assembly, and then carrying out a PID test. By utilizing the accelerated PID testing method provided by the invention, the PID testing time is greatly reduced from some days to some hours by improving testing conditions; the test period is reduced; and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of crystalline silicon solar cells, in particular to a method for testing the reliability of solar cell components. Background technique [0002] In a photovoltaic system, for safety reasons, the aluminum frame of the module is usually grounded, so that the battery terminal will be in a state of negative pressure. Driven by this negative pressure, the current flows from the ground terminal to the battery through the aluminum frame, glass and EVA. During this process, a large amount of positive charges will accumulate on the surface of the battery, causing the battery to fail. This is the attenuation of components under high voltage ( potential induced degradation), referred to as PID. With the development of photovoltaic technology, the number of panels connected in series in large-scale photovoltaic systems is increasing. Under working conditions, some components will be in a high voltage state, usually reaching 600...

AI Technical Summary

Problems solved by technology

For the PID test of solar panels, the method currently used in the industry is usually carried out under high humidity, using the water film on the surface of the module to conduct electricity to form an equipotential surface on the surface of the module. However, due to the poor conductivity of the water film, the test requires a long time. time

This is not conducive to shortening the experimental cycle and improving experimental efficiency; it also causes waste of resources such as environmental test chambers and human resources