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Method and device for testing throughput of WAN (Wide Area Network) at single port and at full wire speed

A high-throughput, single-port technology, applied in the direction of data exchange network, digital transmission system, electrical components, etc., can solve the problems that the correct source test instrument address cannot be obtained, the loopback frame cannot reach the source test instrument, etc., and achieve synchronous two-way Effects of work, reduced complexity, quick summaries

Inactive Publication Date: 2013-05-01
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Existing single-port LAN throughput testing instruments replace the destination and source addresses with IP addresses due to the test frame, and there is no problem in testing the LAN, because the IP address in the subnet is unique, but after crossing the subnet, the destination IP address is The IP address of the router is replaced. When performing loopback, the loopback test frame cannot obtain the correct source test instrument address by exchanging the destination and source IP addresses, resulting in the problem that the loopback frame cannot reach the source test instrument.

Method used

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  • Method and device for testing throughput of WAN (Wide Area Network) at single port and at full wire speed
  • Method and device for testing throughput of WAN (Wide Area Network) at single port and at full wire speed
  • Method and device for testing throughput of WAN (Wide Area Network) at single port and at full wire speed

Examples

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Embodiment 1

[0053] A method for testing the throughput of a WAN network with a single port at full line speed, which is mainly composed of a main control module and a remote intelligent module.

[0054] The main control module mainly includes three parts: the control frame generation module of the remote intelligent module, the full-line speed general test frame generation module, and the receiving test frame statistics module.

[0055] Control the frame generation module, control the working status of the remote intelligent module, start the downlink test of the remote intelligent throughput, request the remote end to send back the statistical results, and send the data statistical results of other connected intelligent devices. Its data frame format is a UDP frame, such as adding the ESC code corresponding to the control frame mark "cect41.comm" at the specified length position of the frame data.

[0056] The full wire speed universal test frame generation module is to generate test dat...

Embodiment 2

[0060] On the basis of the above examples, if figure 1 As shown, when testing the throughput of the WAN, different frame lengths need to be tested according to the standard. In this embodiment, the test data frame adopts the standard UDP frame data format. The frame content can also be customized according to the test needs.

[0061] Test frame format:

[0062] Adopt standard UDP frame format, set its purpose MAC address and IP address, UDP port number and frame data content, in the present embodiment, test frame mainly comprises 2 kinds of test frame formats: test control frame, general test frame.

[0063] Test control frames include test start frames, test stop frames and parameter request frames.

[0064] In the test control frame, it contains the external IP address of the local router and the remote router, the source and destination UDP port numbers of the local test instrument, command word, time label, test cycle, test control parameters and test frame flags, etc., ...

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Abstract

The invention provides a method and a device for testing the throughput of a WAN (Wide Area Network) at a single port and at a full wire speed. The method comprises the following steps of: A, judging whether far-end intelligent equipment is in the same subnet, if so, starting the far-end intelligent equipment to enter an intelligent testing state; otherwise, transmitting an ARP (Address Resolution Protocol) address inquiry frame to determine a gateway address, transmitting a via-network testing starting frame, and starting the far-end intelligent equipment to enter the intelligent testing state; B, transmitting an access verification testing frame to verify network access; C, setting control parameters to test the uplink and downlink throughputs of the WAN respectively; and D, counting received data frames and own data frames by using far-end intelligent loopback equipment, and transmitting back to main control equipment. Due to the adoption of the scheme, testing personnel are not required to set at the two ends respectively, and is only required to set at one end of the main control equipment, so that test data can be summarized in time.

Description

technical field [0001] The invention relates to a method for testing the throughput of a WAN network, in particular to a method and a device for testing the throughput of a WAN network at full line speed with a single port. Background technique [0002] With the increasing popularity and rapid development of the Internet, the business volume of subnet users accessing the Internet is increasing. The network needs to provide network services such as WWW browsing, FTP file transfer, DNS domain name resolution, and e-mail. These factors will cause network traffic to decrease. Dramatic increase. If the throughput of the network platform is too small, it will become a network bottleneck and have a negative impact on the transmission efficiency of the entire network. Therefore, when performing a performance test on a network platform, examining the throughput is a very important technical indicator, which helps to better evaluate its performance. [0003] Throughput (Throughput) ...

Claims

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Application Information

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IPC IPC(8): H04L12/26H04L29/12
Inventor 江勇袁海军孙昊张黎明张奎
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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