Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Substrate heating device

A technology for substrates and supporting substrates, applied in the fields of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problems of difficult and expensive manufacturing base 1, insufficient compensation for heat loss, etc., to improve coating quality and coating Layer properties, effect of uniform coating thickness

Inactive Publication Date: 2013-05-01
东电电子太阳能股份公司
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This solution makes the manufacture of the susceptor 1 difficult and expensive since the tolerances between the different plates of the susceptor 1 must be low enough to allow uniform heating of the substrate 9
Second, it is difficult to obtain a smooth temperature distribution over the gap between the central area 5 and the edge area 8
Depending on the thickness of the substrate 9 the required smearing of the junction between the two regions 5 , 8 may not be sufficient to compensate for the heat loss caused by the junction of the central region 5 with the edge region 8

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Substrate heating device
  • Substrate heating device
  • Substrate heating device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] image 3 A thermal plate or susceptor 1 for supporting and thermally controlling a substrate 9 according to a preferred embodiment of the invention is shown in side view. The base 1 has a substantially flat plane 11 on which the substrate 9 is placed in thermally conductive contact; A specific, non-constant thickness 12.

[0047] The plane 11 has at least three areas or regions 5 , 6 , 7 arranged concentrically around one another. The inner zone 5 is the innermost or central zone which has at least one inner heating element 13 influencing the inner zone 5 . The inner area 5 is completely surrounded by an outer or edge area 7 which also includes the area occupied by the edges and corners 14 of the substrate 9 during operation of the hot plate 1 .

[0048] The middle region 6 is arranged between an inner region 5 which completely surrounds the middle region 6 and an outer region 7 which completely surrounds the inner region 5 . According to the invention, the intermed...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a susceptor for supporting a substrate (9) within a vacuum process chamber, comprising a flat surface (11) for placing the substrate (9) thereon such that the substrate (9) is in thermally conductive contact with the surface (11), whereby the susceptor (1) comprises at least three adjacent zones (5, 6, 8), an outer zone (8), a middle zone (6) and an inner zone (5), the zones (5, 6, 8) arranged concentrically around each other and extending along the surface (11), the outer zone (8) completely surrounds the middle zone (6) and the middle zone (6) completely surrounds the inner zone (5), the inner zone (5) comprises at least one inner heating element (13) affecting the inner zone (5), the outer zone (8) comprises at least one outer heating element (19) affecting the outer zone (8), the middle zone (6) exhibits a maximal thickness (15); that is smaller than the minimal thickness (12) of the inner zone (5) and smaller than the minimal thickness (16) of the outer zone (8), each thickness (12, 15, 16) extending perpendicular to the surface (11). Thus, the invention allows for providing a smooth temperature profile over the complete surface (11) area resulting in a highly uniform substrate (9) temperature and thus in an improved thickness (12, 15, 16) uniformity of a coating to be provided e.g. in a chemical vapour deposition process.

Description

technical field [0001] The invention relates to a susceptor for supporting a substrate within a vacuum processing chamber, said susceptor comprising a plane for seating the substrate thereon such that the substrate is in thermally conductive contact with the plane. More specifically, the present invention relates to establishing a very uniform substrate temperature over a large area of ​​the substrate plane. In particular, the present invention describes a very uniform heating system for heating substrates, preferably of non-circular shape, in a vacuum environment. This heating system can be applied to many coating or substrate processing processes that operate at temperatures higher than room temperature. Background technique [0002] Thin film deposition or coating processes are well known in the art. Since then, deposition uniformity has become an important criterion, especially in the production of large-area coatings. Today, in thin-film technology, layer properties ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/67
CPCH01L21/67109H01L21/67103H01L21/683H01L31/18
Inventor 洛朗·德蓬马库斯·波佩尔勒拉尔夫·施莫尔
Owner 东电电子太阳能股份公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products