Physical property measurement system and method for material based on probe force curve

Abstract

The invention discloses a physical property measurement system and a method for a material based on an AFM (atomic force microscope) probe force curve. According to the method, a high-speed and high-precision digital acquisition card and a digital controller are adopted to realize broad-band and high-resolution measurement during a probe force curve testing process. Therefore, a peak force in the probe force curve can be controlled and measured precisely. On the basis of acquiring the force curve, a Hertz contact model and a Derjaguin-Muller-Toporov (DMT) model are used for acquiring appearance information of the surface of a sample, and a power dissipation and force curve area integral method is used for acquiring a viscous force and dissipated energy information of the sample. According to the system and the method, a large amount of information reflecting physical properties of the surface of the sample is included. The application scope of an AFM is expanded greatly, the development of correlational study fields is promoted, and the system and the method have very important scientific values and good application prospects.

Description

technical field [0001] The invention relates to the field of nanotechnology, in particular to a mesoscopic system material physical property measurement system and method. Background technique [0002] Since the mesoscopic (Mesoscopic) system corresponding to the nanometer scale has both the characteristics of microscopic quantum mechanics and the characteristics of macroscopic objects, it shows a variety of novel characteristics. The research and development of science and technology such as quantum devices has brought new vigor and vitality. Nanoscience and technology have begun to shift from nanoscale mechanistic research on materials, scale phenomena, and principled functional models to research on design, processing, assembly, manufacturing, and functionalization of nanostructures, devices, composite structures, and NEMS, and have begun to form large-scale industry. Nanotechnology has become the world's consensus as a driving force for new technological development. ...

AI Technical Summary

Problems solved by technology

However, most of the current atomic force microscopy techniques only use the force curve to obtain the topography information of the surface of the measured object.

However, the large amount of information contained in the force curve that reflects the physical properties of the sample surface (hardness, viscous force, dissipated energy, etc.) has not been used.

Greatly limit the scope of application of atomic force microscopy and the development of related research fields

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