Physical property measurement system and method for material based on probe force curve

A technology of physical properties and measurement methods, applied in the field of nanotechnology, can solve problems such as limiting the application range of atomic force microscopes, achieve good application prospects, important scientific value, and improve the effect of application range

Inactive Publication Date: 2013-07-03
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

However, most of the current atomic force microscopy techniques only use the force curve to obtain the topography information of the surface of the measured object.
However, the large amount of information contained in the force curve tha

Method used

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  • Physical property measurement system and method for material based on probe force curve
  • Physical property measurement system and method for material based on probe force curve
  • Physical property measurement system and method for material based on probe force curve

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Embodiment Construction

[0034] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0035] The structure of the material physical property measurement system based on the probe force curve is as follows: figure 1 Shown:

[0036] The Ethernet is responsible for the communication with the computing system. The communication module adopts the 10M / 100M Fast Ethernet (Fast Ethernet 10 / 100) interface to realize the command and data information exchange between the controller and the data management interactive system. The software communication adopts the international standard TCP / IP protocol, and the data transmission speed is fast, which can meet the needs of large-flow data transmission, ensure system stability and realize the display of measurement results;

[0037] DSP is the digital signal processing unit responsible for obtaining the physical characteristic information of the sample surface by using the acquired probe forc...

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Abstract

The invention discloses a physical property measurement system and a method for a material based on an AFM (atomic force microscope) probe force curve. According to the method, a high-speed and high-precision digital acquisition card and a digital controller are adopted to realize broad-band and high-resolution measurement during a probe force curve testing process. Therefore, a peak force in the probe force curve can be controlled and measured precisely. On the basis of acquiring the force curve, a Hertz contact model and a Derjaguin-Muller-Toporov (DMT) model are used for acquiring appearance information of the surface of a sample, and a power dissipation and force curve area integral method is used for acquiring a viscous force and dissipated energy information of the sample. According to the system and the method, a large amount of information reflecting physical properties of the surface of the sample is included. The application scope of an AFM is expanded greatly, the development of correlational study fields is promoted, and the system and the method have very important scientific values and good application prospects.

Description

technical field [0001] The invention relates to the field of nanotechnology, in particular to a mesoscopic system material physical property measurement system and method. Background technique [0002] Since the mesoscopic (Mesoscopic) system corresponding to the nanometer scale has both the characteristics of microscopic quantum mechanics and the characteristics of macroscopic objects, it shows a variety of novel characteristics. The research and development of science and technology such as quantum devices has brought new vigor and vitality. Nanoscience and technology have begun to shift from nanoscale mechanistic research on materials, scale phenomena, and principled functional models to research on design, processing, assembly, manufacturing, and functionalization of nanostructures, devices, composite structures, and NEMS, and have begun to form large-scale industry. Nanotechnology has become the world's consensus as a driving force for new technological development. ...

Claims

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Application Information

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IPC IPC(8): G01Q60/24G01N3/00G01N19/04
Inventor 刘志华董再励
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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