Structured light measuring system calibration method based on sinusoidal grating
A sine grating and measurement system technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as many noise points, phase unwrapping failures, errors, etc., and achieve strong robustness, high measurement accuracy, and simple operation. Effect
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[0040] Preferred embodiments of the present invention are given below and described in conjunction with the accompanying drawings.
[0041] Such as figure 1 As shown, a method for calibrating a sinusoidal grating-based structured light measurement system proposed by the present invention mainly includes the following nine steps:
[0042] 1) Make coded gratings; including three row sinusoidal gratings with a phase shift of 120 degrees, three column sinusoidal gratings with a phase shift of 120 degrees, and a pair of coded disk images used to determine the starting point of phase unwrapping:
[0043] When the light intensity of the image projected by the projector satisfies the sinusoidal distribution, then its light intensity can be expressed by formula (1):
[0044] I 0 (x,y)=r 0 (x,y){A(x,y)+B(x,y)cosφ(x,y)} (1)
[0045] Among them, r 0 (x,y) represents the reflectivity of the object surface, A(x,y) is the background light intensity, B(x,y) is the fringe amplitude, φ(x,y...
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