Steady-state analysis-based method for measuring hemispherical total emissivity and heat conduction coefficient

Abstract

The invention particularly discloses a steady-state analysis-based method for measuring a hemispherical total emissivity and a heat conduction coefficient. The steady-state analysis-based method comprises the following steps of: obtaining a long and thin belt-shaped conductor material sample, electrifying in a vacuum environment for heating, selecting one section of region at the middle as a test region, establishing a steady-state energy-balance equation according to a steady state calorimetric method; respectively indicating the hemispherical total emissivity and the heat conduction coefficient as mathematical functions about temperatures; carrying out multiple groups of steady-state measurement experiments under different steady-state temperature conditions so as to construct a steady-state energy-balance equation under different steady-state temperature conditions; and solving a to-be-confirmed parameter in the equation, and determining the hemispherical total emissivity and the heat conduction coefficient of the sample under different steady-state temperature conditions. The steady-state analysis-based method is suitable for measuring the hemispherical total emissivity of various conductor materials in the case that the heat conduction coefficient is unknown, and is also capable of obtaining the heat conduction coefficient of the conductor material so as to avoid the uncertainty influence caused by the unknown heat conduction coefficient to the measurement of the hemispherical total emissivity.

Description

technical field

[0001] The invention relates to the field of hemispherical total emissivity measurement of conductive materials, in particular to a method for simultaneous measurement and inversion of hemispherical total emissivity and thermal conductivity of conductive materials based on steady-state calorimetric analysis. Background technique

[0002] Hemispherical total emissivity is one of the important thermophysical parameters of materials, which characterizes the surface thermal radiation ability of materials, and is an important basic physical property data for the study of radiation measurement, radiation heat transfer and thermal efficiency analysis. With the wide application of new materials in high-tech fields such as energy power and aerospace, more urgent needs have been put forward for the measurement of hemispherical total emissivity. Compared with other thermal physical parameters, the hemispherical total emissivity measurement method The technical research ...

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