A multi-parameter digital signal processing hardware circuit and multi-parameter processing method

Abstract

The invention provides a multi-parameter digital signal processing hardware circuit comprising a selector switch, an A / D sampler, a master processing unit, an FPGA chip and a DSP chip. The selector chip is used for receiving various types of parameter measurement data, selects output signals of the FPGA chip, and sends the selected parameters into the A / D sampler. The A / D sampler converts parameters from analog signals into digital signals, and sends the digital signals into the FPGA chip. The master processing unit is communicated with the FPGA chip and the DSP chip through a PCI bus. The DSP chip is communicated with a PCI interface of the master processing unit through an HPI interface. Logic conversion between the interfaces is achieved through the FPGA chip. The DSP chip is communicated with the FPGA chip through an EMIF interface. The multi-parameter digital signal processing hardware circuit has the advantages that various types of parameters are measured quickly and effectively and time and resources are saved.

Description

technical field [0001] The invention relates to the field of microwave testing, in particular to a multi-parameter digital signal processing hardware circuit and a multi-parameter processing method. Background technique [0002] In the microwave comprehensive test, various parameters such as spectrum, field strength, power, noise figure, standing wave ratio, transmission parameters, and time-domain waveforms need to be tested. The data processing methods and processes required for each measurement parameter are different. In traditional measuring instruments such as spectrum analyzer, field strength meter, power meter, noise figure analyzer, etc., the digital processing program for a certain parameter test is solidified in the whole machine, and the signal reception, signal acquisition and data processing are adopted. The sequentially executed method implements the test function of the corresponding parameter. [0003] For example, in measuring instruments such as spectrum ...

AI Technical Summary

Problems solved by technology

[0005] The invention proposes a multi-parameter digital signal processing hardware circuit and a multi-parameter processing method, which solves the problem in the prior art that the traditional measuring instrument can only realize the test of one parameter and takes a long time

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