Method for Improving the Uniformity of Electrical Parameters of GP CMOS Devices
A technology of electrical parameters and devices, which is applied in the field of improving the uniformity of electrical parameters of GPCMOS devices, can solve problems such as GPSMT process changes, and achieve the effect of improving uniformity and stability
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[0037] The invention provides a surface treatment method using a nitride thin film as a metal silicide barrier layer. The present invention can be used in processes whose technical nodes are greater than or equal to 65 / 55nm, 45 / 40nm, 32 / 28nm and less than or equal to 22nm; the present invention can be used in technical platforms such as Logic and GP.
[0038] In the existing manufacturing process of high-performance devices using stress-memory technology, usually only one-step peak annealing process is used to heat-treat silicon wafers, which has a disadvantage that it will have a large diffusion effect on the previously implanted ions, thereby affecting the performance of the device. Various properties.
[0039] The present invention aims at the above problems, by adding a step of laser annealing in the traditional stress memory process, so that there are two heat treatment process steps in the stress memory technology process with only one heat treatment, namely: peak anneal...
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