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Method for Improving the Uniformity of Electrical Parameters of GP CMOS Devices

A technology of electrical parameters and devices, which is applied in the field of improving the uniformity of electrical parameters of GPCMOS devices, can solve problems such as GPSMT process changes, and achieve the effect of improving uniformity and stability

Active Publication Date: 2015-11-25
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0009] It can be seen that there is not yet an effective method that does not change much in the existing GPSMT process and can improve the uniformity of device electrical parameters.

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  • Method for Improving the Uniformity of Electrical Parameters of GP CMOS Devices

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Embodiment Construction

[0037] The invention provides a surface treatment method using a nitride thin film as a metal silicide barrier layer. The present invention can be used in processes whose technical nodes are greater than or equal to 65 / 55nm, 45 / 40nm, 32 / 28nm and less than or equal to 22nm; the present invention can be used in technical platforms such as Logic and GP.

[0038] In the existing manufacturing process of high-performance devices using stress-memory technology, usually only one-step peak annealing process is used to heat-treat silicon wafers, which has a disadvantage that it will have a large diffusion effect on the previously implanted ions, thereby affecting the performance of the device. Various properties.

[0039] The present invention aims at the above problems, by adding a step of laser annealing in the traditional stress memory process, so that there are two heat treatment process steps in the stress memory technology process with only one heat treatment, namely: peak anneal...

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Abstract

The invention relates to a method for improving uniformity of electrical parameters of GP CMOS components. The method for improving the uniformity of the electrical parameters of the GP CMOS components is applied to the preparation technology of semiconductor devices by adopting a stress memorization technology. The method comprises the steps of providing a substrate with a gate structure arranged on the surface, arranging a drain region and a source region on the two sides, close to the gate structure, of the substrate, preparing a buffer layer to cover the surface of the gate structure and the exposed surface of the substrate, preparing a stress layer to cover the surface of the buffer layer, carrying out etching on the stress layer to retain parts of the stress layer covering the surface of the gate structure, adopting a spike anneal process to carry out heat treatment on the substrate and grid electrodes, removing the remained stress layer, and adopting a laser annealing process to carry out heat treatment on the substrate and the grid electrodes to stop the ions in the source region and the drain region from further diffusing. The GP CMOS prepared by adopting the method has stable saturation currents and threshold voltages.

Description

technical field [0001] The invention relates to a method for improving device performance in a semiconductor device preparation process, in particular to a method for improving the uniformity of electrical parameters of a GPCMOS device. Background technique [0002] In recent years, with the widespread use of mobile phones and portable electronic products, people's requirements for computing speed have gradually increased. [0003] With the progress and development of CMOS technology, high-performance devices (Generic Plus Complementary Metal Oxide Semiconductor, referred to as: GPCMOS) are more and more widely used in electronic products. Among them, the most common ones are used for graphics chip processing, graphics cards, CPUs, fast switches for communications, servers, supercomputers, weather forecasts, missile trajectory simulations, virtual simulations of scientific experiments, etc. All of the above applications require high computing speed , The requirements for fl...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/8238
Inventor 范洋洋孙昌王艳生
Owner SHANGHAI HUALI MICROELECTRONICS CORP