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Adjustable focusing device with banding electron beams

A technology of focusing device and electron beam, which is applied in the direction of time-of-flight electron tubes, circuits, discharge tubes, etc., can solve the problems of small spacing, low focus magnetic field strength, and low electron beam density, so as to achieve large adjustment space and improve power capacity , increase the effect of space

Inactive Publication Date: 2013-10-23
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

[0009] The problem with the above strip-shaped electron beam focusing magnet is that under the same magnet material conditions, the focusing magnetic field strength that can be provided is low, and the electron beam density that can be focused is low; The space provided for the high-frequency structure and cooling structure design is very limited, which severely limits the average power capacity of the tube; the magnetic field distribution that provides electron beam broadside focusing is not very nonlinear, and it is difficult to match the strong nonlinearity. The space charge force of a rectangular electron beam; it is difficult to adjust the lateral focusing of the electron beam by the magnet in the experiment

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  • Adjustable focusing device with banding electron beams
  • Adjustable focusing device with banding electron beams
  • Adjustable focusing device with banding electron beams

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Embodiment Construction

[0036] The structure and characteristics of the device of the present invention will be described below in conjunction with specific embodiments and accompanying drawings. The structure shown in the accompanying drawings is only schematic and does not limit the specific specifications of the device of the present invention, such as the three-dimensional specifications and number of magnets. The replacements, changes and improvements made by personnel on the basis of understanding the present invention still belong to the protection scope of the present invention.

[0037] Reference attached Figure 3a , 3b , 3c, 3d, 3e, the belt-shaped electron beam adjustable focusing device of the present invention is made up of two focusing magnet plates facing each other, each focusing magnet plate includes a fixing plate 5, and a plurality of fixing plates are arranged on the fixing plate The used screw uses screw hole 1, and three groups of axially symmetrical QM magnets are installed o...

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Abstract

The invention discloses an adjustable focusing device with banding electron beams. The adjustable focusing device consists of two opposite focusing magnet plates, wherein each focusing magnet plate comprises a fixed plate; a plurality of groups of axially symmetrical QM magnets are arranged on the upper surface of the fixed plate; a plurality of pairs of shielding magnets are arranged on the lower surface of the fixed plate; a PCM magnet is distributed between every two adjacent shielding magnets; and each group of opposite QM magnets on the two focusing magnet plates are geometrically in symmetric distribution to form a QM magnet with a four-pole structure. The adjustable focusing device with banding electron beams is effectively applicable to the focusing of the banding electron beams with various depth-width ratios.

Description

technical field [0001] The invention relates to a focusing device for a ribbon beam vacuum microwave tube, in particular to a novel ribbon electron beam adjustable focusing device. Background technique [0002] Microwave vacuum devices are devices that convert the direct current energy carried by electrons into microwave energy through the movement of electrons in vacuum. The electron beam generated by the electron gun interacts with the high-frequency field in the high-frequency structure, thereby converting the DC energy into high-frequency energy. [0003] In order to maintain the shape and normal movement of the electron beam, an additional focusing system is also introduced. The focusing system is usually composed of a magnetic field. The focusing system mainly ensures that the electron beam maintains a certain shape and does not have a high-frequency structure due to diffusion. [0004] The cross-sectional shape of the electron beam can be circular, rectangular and ci...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J23/087
Inventor 王建勋罗勇杨容刘国王丽徐勇鄢然
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA