Unlock instant, AI-driven research and patent intelligence for your innovation.

Method and system for sensor testing

A test method and test system technology, applied in the test field, can solve problems such as system downtime, affecting system heat dissipation, hazards, etc., and achieve the effect of reducing the risk of hardware damage

Inactive Publication Date: 2013-11-13
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The specific threshold values ​​of the fan sensor are LNC and LC. The corresponding actual detection significance is that the fan speed is too low and the fan speed is too low. Too low fan speed will affect the heat dissipation of the system, which may cause the system to shut down due to overheating , and even further harm
[0004] In the earlier sensor trigger test, it is first necessary to start the server motherboard and some I / O components, so that the value read by the sensor is outside the specified threshold value, thereby triggering the recording of the server system exceeding the threshold value Log, in this way, by changing the actual working status of the sensor, the baseboard management controller can obtain the actual value of the sensor exceeding the current threshold value, thereby recording the system event log corresponding to the sensor beyond the threshold value, but relatively speaking, the operation The most complicated, and a little carelessness may cause damage to the board

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for sensor testing
  • Method and system for sensor testing
  • Method and system for sensor testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] like figure 1 is an operating environment diagram of the sensor testing system of the present invention. The sensor testing system 10 runs on a server 1 , and the server 1 includes a processor 12 , a memory 14 , a sensor to be tested 16 , and a baseboard management controller 18 .

[0017] The sensor test system 10 runs on the server 1, and needs to be operated through the IPMI service. The system modifies the threshold value of the sensor so that the actual reading value of the sensor breaks through the threshold value and triggers the generation of a new system event log, and checks The correctness of the system event log avoids changing the actual working status of the processor, fan and other components in the past, so that the sensor reading value exceeds the default threshold to trigger the generation of the system event log, reducing the risk of hardware damage. IPMI (Intelligent Platform Management Interface) is an intelligent platform management interface, whic...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and a system for sensor testing. The method for sensor testing comprises the following steps of obtaining a sensor serial number belonging to the type of the sensor to be tested, polling and obtaining a sensor serial number, obtaining the name of a corresponding sensor, modifying a default threshold value of the sensor to be tested to enable a current read value to exceed the modified threshold value, inquiring a newly generated log according to a keyword formed by the type name of the threshold value and the name of the sensor to be tested, recording the testing state of the sensor to be tested when the keyword is contained, modifying the current threshold value of the sensor to be tested back to the default value, checking a system event log generated in a triggering mode according to the keyword formed by the type name of the threshold value and the name of the sensor to be tested, recording the testing state of the sensor to be tested when the keyword is contained, judging whether polling is finished, finishing the process if the polling is finished, and if not, returning to the polling step until all the obtained sensor serial numbers are polled. Through the method of modifying the threshold value of the sensor to simulate triggering, the method and system for sensor testing avoid the risks of hardware damage.

Description

technical field [0001] The invention relates to a testing method and system, in particular to a sensor testing method and system. Background technique [0002] The sensors integrated on the server are used for real-time monitoring of the important components of the server motherboard. According to actual needs, they can be divided into physical sensors and program-set sensors. They are relatively independent of the baseboard management controller (BMC) of the server operating system. Get real-time information from sensors to understand the health of the system. Physical sensors include voltage sensors, temperature sensors, and fan sensors, which are suitable for voltage (voltage), temperature (temperature), and Fan (fan) types of sensors. Program sensors are added in the form of software algorithms, for example, the Multi bit ECC error and single bit error of the memory fall into this category. The threshold values ​​of physical sensors are roughly divided into six types, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00
CPCG06F11/2221G01K15/007G01P21/02G01R35/00G01D18/00G06F11/00G06F15/00
Inventor 梁霄李明
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD