Silicon steel texture measuring method

Abstract

The invention discloses a silicon steel texture measuring method. The silicon steel texture measuring method comprises the following steps of preparing an EBSD analysis sample, measuring orientation distribution diagrams of half-thickness areas at three or more different positions of a longitudinal section of the sample by EBSD equipment, dividing a measured area into at least 10 equal-area zones from the steel plate surface to the plate thickness center, carrying out analysis to obtain ODF diagrams of the different positions, calculating density fractions f (hkl) of all crystal faces {hkl}, calculating an average value of the density fractions f (hkl) of the crystal faces {hkl} which are in different positions and have the same thickness, and drawing a data diagram of the silicon steel texture along a plate thickness direction. Through measurement of the ODF diagrams and quantitative calculation of the density fractions f (hkl) of the crystal faces {hkl}, the problem of high difficulty of XRD quantitative analysis is solved. Through measurement of data of multiple zones, the error caused by a too small EBSD measuring zone is eliminated and data is more accurate.

Description

technical field [0001] The invention relates to a method for measuring silicon steel, in particular to a method for measuring the texture of silicon steel. Background technique [0002] Grain-oriented silicon steel is an important soft magnetic material widely used in electric power and electronic industries. If the preferred orientation is obtained, the arrangement of individual grains makes the <001> axis almost parallel to the rolling direction of the steel plate, which can reduce the iron loss of oriented silicon steel, increase the magnetic permeability, and increase the magnetic circuit in the direction of easy magnetization, making the material more suitable for Therefore, improving the texture is an effective way to reduce iron loss and increase magnetic permeability. [0003] Studying the texture of silicon steel sheets in different processes such as hot rolling, normalization, and decarburization annealing is the key to controlling the production process of ...

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Problems solved by technology

[0005] 1. It is difficult to prepare samples. To obtain samples with different thicknesses, different thinning methods are required. The disadvantages of the main sample preparation methods are as follows: mechanical grinding takes a long time, and it is difficult to keep the grinding surface on a flat surface; chemical corrosion is difficult to control Corrosion time and thickness; wire cutting requires special cutting equipment;

[0006] 2. The detection cycle is long, because the measurement process requires repeated sample thinning → X-ray measurement, so the cycle is long;

[0007] 3. It can only measure the texture of a limited number of typical thickness positions, such as 1 / 4 of the plate thickness and the center, etc. If it is necessary to increase the measured thickness position, the measurement time will be significantly prolonged

[0008] Therefore, using traditional X-rays to measure the texture along the thickness direction of the steel plate has problems such as difficult sample preparation, long cycle time, few measurement points, and large measurement errors.

[0009] In addition, traditional texture measurement methods such as X-ray diffraction (XRD) can only measure the macroscopic texture, but cannot measure the orientation relationship of micro-domains or each grain.

Moreover, the error of the quantitative calculation results by measuring the ODF pattern with XRD is relatively large

Another method of measuring texture is EBSD, that is, electron backscatter diffraction (electron backscatter diffraction), which can measure the grain orientation distribution map of micro-regions, but there are problems of relatively small measurement range and large errors

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