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X-ray combined refraction lens focusing performance test device

A technology combining a refractive lens and a testing device, which is applied in the field of X-ray detection and imaging, can solve the problems of poor practicability, expensive operation and maintenance, and complicated mechanism, and achieves the effects of small size, light weight and convenient use.

Active Publication Date: 2016-04-13
江苏意尔重工有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the deficiencies of the existing X-ray composite refraction lens focusing performance testing methods, which are complex in mechanism, expensive in operation and maintenance, and poor in practicability, the present invention provides an X-ray composite refractor with simplified structure, greatly reduced cost, and good practicability. Lens focusing performance test device

Method used

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  • X-ray combined refraction lens focusing performance test device
  • X-ray combined refraction lens focusing performance test device
  • X-ray combined refraction lens focusing performance test device

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Embodiment Construction

[0019] The present invention will be further described below in conjunction with the accompanying drawings.

[0020] refer to figure 1 And Fig. 2, a kind of X-ray combined refraction lens focusing performance testing device, comprise base rail 7, be positioned at the X-ray light tube 1 on described base rail 7, laser 2, metal wire 5 and X-ray detection device 6, described The base guide rail 7 is arranged longitudinally;

[0021] The adjustment table 3 is located on one side of the base guide rail 7, the optical axes of the X-ray light tube 1 and the laser 2 are arranged longitudinally, and the X-ray light tube 1 and the laser 2 are mounted on the adjustment table so that they can move laterally. On the stage 3; the X-ray combined refracting lens 4 to be detected is located in the middle of the base rail 7, and the optical axis of the X-ray combined refractive lens 4 to be detected is longitudinally arranged; the X-ray detection device 6 is positioned on the base rail 7, the...

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Abstract

The invention discloses a device for testing the focusing performance of an X-ray compound reflective lens. The device comprises a base guide rail, an X-ray light pipe located on the base guide rail, a laser, a metal wire and an X-ray detecting device. An adjusting table is located on one side of the base guide rail, and the X-ray light pipe and the laser can be horizontally and movably installed on the adjusting table. The X-ray compound reflective lens to be detected is located in the middle of the base guide rail, and the X-ray detecting device is located on the other side of the base guide rail. An adjusting support can be longitudinally and movably arranged on the base guide rail between the X-ray compound reflective lens to be detected and the X-ray detecting device. A horizontal sliding block can be horizontally and movably arranged on the adjusting support, the metal wire used for cutting detected light beams which are focused by the X-ray compound reflective lens is installed on the horizontal sliding block, and the size of the metal wire needs to meet the requirement for micron dimension. The device for testing the focusing performance of the X-ray compound reflective lens is capable of simplifying the structure and greatly reducing cost, and good in practicality.

Description

technical field [0001] The invention relates to the field of X-ray detection and imaging, in particular to a device capable of measuring the focusing performance of an X-ray combined refraction lens. Background technique [0002] The X-ray combined refraction lens is a new type of X-ray focusing device based on the refraction effect. Its theoretical focus spot size can reach the nanometer level. The actual test focus spot size is usually several microns, and it has small size, simple manufacturing process, The advantages of good robustness and batch processing are suitable for X-ray detection and imaging systems with high detection resolution; secondly, the X-ray combined refraction lens covers a very wide range of photon energies, so X-ray detection and imaging systems based on it are suitable for In a variety of applications; finally, because it is based on the refraction effect, it does not need to bend the optical path when focusing the X-ray beam, so the formed detectio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 乐孜纯董文
Owner 江苏意尔重工有限公司