A Random Sampling Slope Analog-to-Digital Converter

An analog-to-digital converter and random sampling technology, applied in the direction of analog-to-digital converters, etc., can solve the problems of high sampling frequency and high counter requirements

Active Publication Date: 2016-08-24
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

[0006] In view of this, the main purpose of the present invention is to provide a random sampling slope analog-to-digital converter, aiming at solving the problem that the existing random sampling slope analog-to-digital converter has a high sampling frequency when the input signal amplitude is small and the input signal amplitude value is relatively small. The problem of high requirements on the counter when it is large

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  • A Random Sampling Slope Analog-to-Digital Converter
  • A Random Sampling Slope Analog-to-Digital Converter
  • A Random Sampling Slope Analog-to-Digital Converter

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[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0023] figure 1 Shown is a schematic diagram of an existing random sampling slope analog-to-digital converter, figure 2 Shown is an existing random sampling slope analog-to-digital converter compression sampling diagram, the existing random sampling slope analog-to-digital converter adopts a fixed slope k 0 The reference signal is compared with the input signal.

[0024] image 3 Shown is the improved random sampling slope analog-to-digital converter schematic diagram provided by the present invention, in figure 1 Based on the existing random sampling slope analog-to-digital converter schematic diagram, a pre-stage limiter is added, Figure 4 Shown is a schematic diagram of compressed sampling of the improved random ...

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Abstract

The invention discloses a random sampling slope analog-to-digital converter, which comprises a slope signal generator, a comparator and a counter connected in sequence, the reference signal generated by the slope signal generator and the input signal from the outside are respectively input to one end of the comparator for comparison The comparison is carried out in the comparator, and the counter starts counting at the same time. The random sampling slope analog-to-digital converter also includes: a limiter, the input signal from the outside is input to one end of the comparator through the limiter, and the limiter is based on The amplitude of the input signal controls the slope signal generator to generate reference signals with different slopes. The invention solves the problem that the existing random sampling slope analog-to-digital converter has a higher sampling frequency when the input signal amplitude is small and a higher requirement on the counter when the input signal amplitude is large.

Description

technical field [0001] The present invention relates to a random sampling slope analog-to-digital converter, aiming to solve the problem that the existing random sampling slope analog-to-digital converter has higher sampling frequency when the input signal amplitude is small and higher requirements on the counter when the input signal amplitude is large question. Background technique [0002] American telecommunications engineer H. Nyquist first proposed the Nyquist sampling theorem in 1928, which pointed out that in order to reconstruct the original signal from the sampling value without distortion, the sampling frequency of the signal must be greater than or equal to twice the highest signal frequency. This theory has become the basis of all signal acquisition, processing, storage and transmission stages. However, with the development of information processing technology and wireless sensing technology, the amount of data to be processed is increasing and the frequency of...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/12
Inventor 李冬梅李小静梁圣法张浩罗庆谢常青刘明
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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