Temperature measuring method based on HF first overtone emission spectrum

An emission spectrum and temperature measurement technology, which is applied in the field of temperature measurement of HF chemical laser supersonic flow field, can solve the problem of no discovery, and achieve the effect of good stability and high precision

Inactive Publication Date: 2014-02-19
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

Through a large number of domestic and foreign literature, no other simple and effective HF chemical laser temperature measurement method has been found

Method used

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  • Temperature measuring method based on HF first overtone emission spectrum
  • Temperature measuring method based on HF first overtone emission spectrum
  • Temperature measuring method based on HF first overtone emission spectrum

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Embodiment Construction

[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0024] use figure 1 The shown method realizes the measurement of the cavity temperature of an HF chemical laser.

[0025] The near-infrared light collection and transmission system uses near-infrared optical fiber, which is placed on the side of the high-reflection mirror of the optical cavity. 1.36um, effectively realize the separation of strong laser output and weak spontaneous emission signal. Using OMAV as the spectrum analysis measurement system, the obtained HF first overtone vibration-rotation spectrum distribution is shown in figure 2 . The temperature of the system can be calculated by using the intensity distribution data of the R branch with v=2-0, the P branch with v=2-0 and the R branch with v=3-1 in the vibration-rotational spectrum, respectively. In this example, we use the P branch strength distribution data of v=2-0 to ca...

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Abstract

The invention belongs to the technical field of temperature measuring and discloses a temperature measuring method based on an HF first overtone emission spectrum, for the purpose of solving the temperature measuring problem of the ultrasonic flow field of an HF chemical laser. The method comprises: using a near-infrared spectrometer to measure HF first overtone emission spectrum signals, and then using the vibration-rotation intensity distribution formula of the HF first overtone emission spectrum to carry out numerical fitting on obtained data so as to calculate the temperature of a measuring system. The method can be applied to temperature distribution testing of different positions (a jet pipe outlet, an optical cavity and an optical cavity downstream ) and different stages (non-laser output and laser output) of an HF chemical laser flow field and can be popularized to other systems generating high vibration state HF (V>=2). The method has the advantages of simplicity, high precision, good stability and non interference with a testing body.

Description

technical field [0001] The invention belongs to the technical field of temperature measurement of HF chemical laser supersonic flow field, and is used for temperature measurement of HF chemical laser system and other systems containing HF high vibration state (vibration energy level V≥2). Background technique [0002] HF chemical laser is currently one of the two most successful chemical lasers. The stimulated radiation of the HF chemical laser occurs in the vibration-rotational excited state of the HF molecule. The mainstream combustion-driven HF chemical laser uses the combustion method to pyrolyze to generate F atoms, and the generated F atoms are cooled and accelerated by the supersonic nozzle to combine with H2 The reaction produces vibrationally excited HF molecules (V = 1-3), usually with population inversion at some rotational energy levels of V = 1 and 2. Selecting the appropriate coupling output cavity mirror can realize the multispectral fundamental frequency HF ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K11/00
Inventor 唐书凯多丽萍李留成于海军金玉奇桑凤亭
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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