Method for determining whole-cycle ambiguity of three-frequency carrier phase of BeiDou navigation system

A technology of Beidou navigation system and whole circle ambiguity, which is applied in the application field of Beidou satellite navigation, can solve the problems of determination result error, narrow-lane combined ambiguity calculation result deviating from the real value, etc., and achieve the goal of eliminating orbit error and random noise error Effect

Active Publication Date: 2014-03-26
BEIJING RES INST OF TELEMETRY +1
View PDF5 Cites 41 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] This simple step-by-step rounding method without geometry mode has certain defects, that is, in the process of determining the integer ambiguity of the carrier phase narrow-lane combination with the carrier-phase wide-lane combination as the initial value, the estimation error is close to 1 / 2 narrow-lane wavelength, therefore, when the original carrier phase measurement noise is large, it is very easy to cause the calculation result of the narrow-lane combined ambiguity to deviate from the real value, which in turn causes the carrier phase ambiguity of the frequency B1, B2, and B3 to fluctuate. OK result error

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for determining whole-cycle ambiguity of three-frequency carrier phase of BeiDou navigation system
  • Method for determining whole-cycle ambiguity of three-frequency carrier phase of BeiDou navigation system
  • Method for determining whole-cycle ambiguity of three-frequency carrier phase of BeiDou navigation system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0056] The method for determining the integer ambiguity of the three-frequency carrier phase of the Beidou navigation system according to the present invention will be further described in detail with reference to the accompanying drawings and specific embodiments.

[0057] The Beidou navigation system tri-frequency carrier phase integer ambiguity determination method according to the present invention comprises the following steps:

[0058] (1) According to the characteristics of the three carrier frequencies of Beidou satellite navigation signals B1, B2, and B3, the carrier measurement data of the three frequencies are multiplied by specific coefficients (required to be an integer combination whose sum of the coefficients is 0) for linear Combination to form carrier phase combination observations. Then, in different carrier linear combinations, according to the selection criteria that the combined wavelength is as large as possible and the ionospheric coefficient is as small...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for determining a whole-cycle ambiguity of a three-frequency carrier phase of a BeiDou navigation system. The method comprises the steps of by utilizing the advantage of high determination accuracy rate of a whole-cycle ambiguity of a BeiDou ultra-wide lane carrier phase combination, firstly determining whole-cycle ambiguities of two groups of ultra-wide lane carrier phase combinations, and correcting a pseudo-range initial value through the whole-cycle ambiguities of the ultra-wide lane carrier phase combinations; meanwhile, removing influences from an orbit error, a clock error and an ionized layer error in original observed quantity by combining with carrier phase observation quantity of geometry-free de-ionized layer composed of a narrow lane carrier phase combination, so as to enable the resolution of the whole-cycle ambiguity of the narrow lane carrier phase combination to be only affected by random measurement noise; taking an average value of combined observation quantity of multiple epochs to remove random noise error and determine the whole-cycle ambiguity of the narrow lane carrier phase combination; finally, determining the whole-cycle ambiguity of the carrier phases of three frequencies B1, B2 and B3 by resolving a system of linear equations which is composed of the whole-cycle ambiguities of the two ultra-wide lane carrier phase combinations and the whole-cycle ambiguity of the narrow lane carrier phase combination.

Description

technical field [0001] The invention belongs to the technical field of Beidou satellite navigation applications, and in particular relates to a method for determining the ambiguity of the three-frequency carrier phase of the Beidou navigation system. Background technique [0002] With the rapid construction of my country's Beidou satellite navigation system, the Beidou navigation system will soon provide navigation and positioning services for users around the world. A notable feature of the Beidou navigation signal is that it provides carrier signals of three frequencies B1, B2, and B3 at the same time. At present, high-precision navigation and positioning is carried out through satellite navigation, and the carrier phase measurement data of the three frequencies of B1, B2, and B3 of the receiver are mainly used. As a navigation positioning observation. However, there are integer ambiguity unknowns in the carrier phase measurement data of these three frequencies that need ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01S19/44
CPCG01S19/44
Inventor 苗赢赵晓峰
Owner BEIJING RES INST OF TELEMETRY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products