Method and system for controlling chip die bonder
A control method and technology of a die bonding machine, which are applied in the manufacturing of semiconductor/solid-state devices, electrical components, circuits, etc., can solve the problems such as the positioning accuracy not reaching the preset index, the leakage of multiple chip positions, and the inability to identify all of them. , to achieve good positioning effect, reduce the amount of calculation, and avoid the effect of misjudgment of classification
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[0032] The present invention will be further described below in conjunction with specific examples.
[0033] A method for controlling a chip bonder, comprising the following steps:
[0034] Step 1. Obtain the image of the motion platform, which contains wafer information; in this embodiment, as figure 1 shown;
[0035] Step 2. Determine the positional relationship between the wafer on the motion platform and the object to be operated according to the image:
[0036] 2.1. Preprocessing the acquired image of the motion platform; preprocessing includes grayscale processing and binarization processing of the image;
[0037] 2.2, use the edge detection algorithm (canny edge operator is selected to calculate in this embodiment) to the preprocessed image to obtain the edge image; in this embodiment, for example figure 2 shown;
[0038] 2.3. Extract moment invariant features from edge images;
[0039] 2.4. According to the invariant moment characteristics, the three-dimensional ...
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