A Control System Structure for Functional Adjustment of Photolithography Projection Objective Lens

A technology of lithography projection and control system, which is applied to microlithography exposure equipment, photolithographic process exposure devices, etc., can solve the problems of long adjustment time, affecting imaging quality, and the inability of capacitive sensors to perform long-distance transmission, so as to improve the realization of Efficiency, the effect of shortening the adjustment time

Inactive Publication Date: 2015-11-25
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The purpose of the present invention is to propose a control system structure for the functional adjustment of the lithographic projection objective lens, so as to solve the problems in the prior art that the thermal power generated by the piezoelectric driver affects the imaging quality, and the capacitive sensor cannot perform long-distance transmission and long adjustment time.

Method used

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  • A Control System Structure for Functional Adjustment of Photolithography Projection Objective Lens
  • A Control System Structure for Functional Adjustment of Photolithography Projection Objective Lens

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Embodiment Construction

[0017] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0018] See attached figure 1 , the structure of a control system for functional adjustment of a lithographic projection objective lens of the present invention includes a control cabinet 1, a power amplifier cabinet 4, a level conversion cabinet 15, a piezoelectric driver 8 and a capacitive sensor 17;

[0019] The control cabinet 1 includes a standard VME backplane 10, a main control board 11 and an optical fiber communication board 2, and the main control board 11 and the optical fiber communication board 2 are inserted on the standard VME backplane 10, so The power amplifier chassis 4 includes a non-standard VME backplane 12, a core algorithm board 13 and a drive acquisition board 5, and the core algorithm board 13 and the drive acquisition board 5 are inserted on the non-standard VME backplane 12, The analog-to-digital conversion board 14 is included...

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Abstract

The invention provides a structure of a control system for the functional adjustment of a photoetching projection objective lens, and belongs to the field of control on the photoetching projection objective lens. The invention aims to solve the problems that thermal power generated by a piezoelectric actuator influences the imaging quality and a capacitive sensor cannot carry out long-distance transmission and is long in adjustment time in the prior art. The structure of the control system for the functional adjustment of the photoetching projection objective lens comprises a control case, a power amplification case, a level switching case, a piezoelectric actuator and a capacitive sensor, wherein an optical fiber communication board card of the control case is connected with a core algorithm board card of the power amplification case by an optical fiber transmission chain; a driving collection board card of the power amplification case is connected with an analogue-digital conversion board card of the level switching case by a digital signal conversion chain; the driving collection board card of the power amplification case is connected with the piezoelectric actuator through a high-voltage analogue signal transmission chain; the analogue-digital conversion board card of the level switching case is connected with the capacitive sensor through a low-voltage simulation signal transmission chain; the piezoelectric actuator and the capacitive sensor are arranged on the photoetching projection objective lens.

Description

technical field [0001] The invention belongs to the field of photolithographic projection objective lens control, and in particular relates to a control system structure for functional adjustment of a photolithographic projection objective lens. Background technique [0002] The lithography projection objective lens is an ultra-precision optical system. Functional adjustment is the main method used to compensate for the image quality degradation caused by environmental changes in the lithography projection objective lens. The adjustment time of the functional adjustment is two times of instantaneous field of view exposure. The time interval is usually 0.1s-0.2s to ensure the output of the lithography machine. Functional adjustment can be realized by using a piezoelectric driver to drive the image quality sensitive lens and using a capacitive sensor as position feedback. However, the piezoelectric driver needs to be driven by a high-voltage drive. If it is placed around the o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03F7/20
Inventor 李佩玥崔洋尹志生郑楠王学亮
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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