A Control System Structure for Functional Adjustment of Photolithography Projection Objective Lens
A technology of lithography projection and control system, which is applied to microlithography exposure equipment, photolithographic process exposure devices, etc., can solve the problems of long adjustment time, affecting imaging quality, and the inability of capacitive sensors to perform long-distance transmission, so as to improve the realization of Efficiency, the effect of shortening the adjustment time
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[0017] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.
[0018] See attached figure 1 , the structure of a control system for functional adjustment of a lithographic projection objective lens of the present invention includes a control cabinet 1, a power amplifier cabinet 4, a level conversion cabinet 15, a piezoelectric driver 8 and a capacitive sensor 17;
[0019] The control cabinet 1 includes a standard VME backplane 10, a main control board 11 and an optical fiber communication board 2, and the main control board 11 and the optical fiber communication board 2 are inserted on the standard VME backplane 10, so The power amplifier chassis 4 includes a non-standard VME backplane 12, a core algorithm board 13 and a drive acquisition board 5, and the core algorithm board 13 and the drive acquisition board 5 are inserted on the non-standard VME backplane 12, The analog-to-digital conversion board 14 is included...
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