A Rapid Measuring System for Angular Distribution Characteristics of Photometric and Chromatic Parameters of Light Source
A colorimetric parameter, measurement system technology, applied in the field of optical measurement, can solve the problem of long measurement time (often several minutes or even more than 30 minutes, unable to measure color distribution characteristics, not considering the effect of temperature, etc., to achieve short measurement time. , low cost and high precision
Active Publication Date: 2017-04-19
CHINA JILIANG UNIV
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Problems solved by technology
These methods generally adopt a rotating dual-axis design for the measurement of spatial angular distribution characteristics, which leads to long measurement time (often several minutes or even more than 30 minutes), low angular resolution, complex system structure, and high measurement cost.
Moreover, these devices can only measure the distribution characteristics of light intensity, but cannot measure the color distribution characteristics in a certain direction, as well as the relationship between light intensity and wavelength.
Moreover, these devices have not considered the influence of temperature on the measurement results, but in fact, the influence of the temperature of the high-power light source on the measurement results cannot be ignored
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[0022] The specific implementation manners provided by the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0023] See attached image 3 , in the present embodiment, its diameter size of half integrating sphere (2) is 1000mm; 93% high-reflection metal aluminum film; there are four filter holes on the filter plate (5), one of which does not have any filter, and three of which are placed with three interference filters of different transmission wavelengths , the transmission wavelengths are 435.8nm, 546.1nm and 700nm respectively; the resolution of the CCD camera (6) is 512×512 pixels, and the spectral response range covers 350-1100nm; the diffuse reflection layer (9) is coated with a diffuse reflection coefficient of 8% barium sulfate-based mixed coating mixed with gray paint; high absorption black coating (10) coated with a black matte coating with an absorption coefficient of 98%.
[0024] In the following, the spe...
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The invention discloses a fast measuring system for the angular distribution characteristics of light source photometric and chromaticity parameters, which comprises a light source (1), a semi-integrating sphere (2), a baffle (3), an aspheric reflector (4), and an optical filter Disc (5), CCD camera (6), computer (7). The semi-integrating sphere (2) is composed of a hemispherical surface (21) and a bottom surface (22), the inner surface of the hemispherical surface is coated with a diffuse reflection layer (9), and the inner surface of the bottom surface is coated with a high absorption coating (10). A first circular hole (23), a baffle (3), an aspheric reflector (4), and a temperature control system (8) are arranged on the bottom surface, and a second circular hole (24) is arranged on the hemispherical surface. The filter disc is between the CCD camera and the second circular hole. The light beam emitted by the light source shines on the inner surface of the semi-integrating sphere, after diffuse reflection and aspheric mirror, it is detected by the CCD camera through the filter disc, and the signal is calculated by the computer and the correction model to obtain the light source luminosity and chromaticity parameters Angular distribution characteristics.
Description
technical field [0001] The invention belongs to the technical field of optical measurement, and in particular relates to a rapid measurement system for the angular distribution characteristics of the luminosity and chromaticity parameters of a light source. Background technique [0002] Measuring the angular distribution characteristics of photometric and chromaticity parameters of a light source is of great significance in the application fields of lighting source characteristic analysis, computer vision, face recognition, and material surface performance analysis. It can be used to improve the secondary optical design of LED; it can be used for optical performance inspection of various products such as LCD, automobile exterior surface, film film, etc.; further object scattering analysis, including BRDF (bidirectional reflection distribution function) and BTDF (bidirectional transmission distribution function) ), etc., can comprehensively evaluate the surface properties of ...
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IPC IPC(8): G01M11/02
Inventor 金怀洲金尚忠杨初曾珊珊鲁玉红邵茂丰郑健
Owner CHINA JILIANG UNIV