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A Distributed Event Injection Device Based on Combined Test Set

A combination test and event injector technology, applied in the direction of electrical components, response error generation, digital transmission system, etc., can solve the problems of poor customizability, waste of resources, and large consumption of event injection methods, and achieve event injection methods Flexible, efficient event injection, less resource consumption

Active Publication Date: 2017-06-20
HARBIN ENG UNIV
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  • Application Information

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Problems solved by technology

[0004] From the above analysis, we can see that the main shortcomings of event injection research at this stage are: 1) Injecting a unified event into all target systems based on a fixed event injection set consumes a lot of resources and is easy to cause waste of resources; 2) Does not consider the distributed target system Different target units are suitable for injecting different types of faults or different levels of load, that is, the injection method is not flexible and pertinent; 3) The customizability of the event injection method is not strong, and it is not suitable for evaluating personalized indicators

Method used

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  • A Distributed Event Injection Device Based on Combined Test Set
  • A Distributed Event Injection Device Based on Combined Test Set
  • A Distributed Event Injection Device Based on Combined Test Set

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Embodiment Construction

[0018] Attached below Figure 1-3 The present invention is further described.

[0019] The event injection device based on the combined test set involved in the present invention, on the basis of fault injection, also considers other application-level non-fault events that damage system availability, such as pressure load and the like. This device realizes the injection of more targeted events into each target unit in the target system in the form of a combined test set, achieves flexible and efficient implementation of event injection, and then obtains the purpose of computer system availability, and can provide a basis for the evaluation of computer fault-tolerant systems. Efficiently analyze data.

[0020] The event injection device includes four main modules, which are controller, combined test set generation module, event injection module and state analysis module. See the attached module structure diagram figure 1 .

[0021] 1. Controller

[0022] Responsible for co...

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Abstract

The invention relates to a distributed event injection device based on a combined test set for a computer fault-tolerant system. The invention includes a controller, a combined test set generation module, an event injection module and a state analysis module. In the event injection technology, the present invention fully considers the distributed design structure commonly used in today's computer systems, fully considers the problem that different target units are suitable for injecting different types of faults and different levels of load, and introduces a distributed event injection method based on combined test sets , to achieve more flexible and efficient event injection. Therefore, the present invention has the advantages of wide application range, less resource consumption, flexible event injection mode, strong pertinence, and customizability. It can be widely used in distributed fault-tolerant systems, especially in availability evaluation of dedicated fault-tolerant systems.

Description

technical field [0001] The invention relates to a distributed event injection device based on a combined test set for a computer fault-tolerant system. Background technique [0002] With the development of computer technology, the application fields of computer fault-tolerant systems are becoming wider and wider, and the problems faced by the design and evaluation of fault-tolerant systems are becoming more and more complex. For traditional software and hardware faults, the evaluation of computer system availability is generally implemented by fault injection. However, in some special cases, such as unplanned failure of the system, significant increase in workload or long-term saturation work, etc., will lead to non-fault events such as downtime, which will lead to decreased availability. Traditional fault injection technology can no longer Meet the usability evaluation requirements of computer fault-tolerant systems. Therefore, extending the traditional fault injection te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26G06F11/07
Inventor 王慧强何占博冯光升吕宏武郭方方林俊宇
Owner HARBIN ENG UNIV
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