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511results about How to "Efficient injection" patented technology

Method of fabricating a fast programmable flash E2PROM cell

InactiveUS6034896ALarge capacitySuitable for battery operated portable equipmentTransistorRead-only memoriesElectric fieldHot electron
PCT No. PCT/CA96/00446 Sec. 371 Date Jun. 24, 1998 Sec. 102(e) Date Jun. 24, 1998 PCT Filed Jul. 3, 1996 PCT Pub. No. WO97/02605 PCT Pub. Date Jan. 23, 1997A flash E2PROM cell having source and drain regions disposed in a substrate, a channel region intermediate to the source and drain regions, a tunnel dielectric layer overlying the channel region, a floating gate overlying the tunnel dielectric layer, an inter-poly dielectric layer overlying the floating gate, and a control gate overlying the inter-poly dielectric layer. The flash E2PROM cell further having a highly doped p+ pocket implant covering a portion of the cell width and adjacent to at least one of the drain and source regions. The flash E2PROM cell is comprised of two sections butted together. The portion (width-wise) that is covered by the highly doped p+ pocket implant is referred to as a program section. The remaining portion (width-wise) not covered by the highly doped p+ pocket implant resembles a conventional flash E2PROM cell and is referred to as a sense section. The highly doped p+ pocket implant and the n+ drain and/or source regions create a junction having narrow depletion width so that when the junction is reversed biased, an electric field is created for generating hot electrons for storage on the floating gate, thereby programming the flash E2PROM cell when a high positive potential is applied to the control gate.
Owner:UNIV OF TORONTO INNOVATIONS FOUND THE

Vehicle-mounted repairing equipment and method for polluted site soil and underground water body

The invention provides vehicle-mounted repairing equipment for polluted site soil and underground water body, which comprises a dry powder hopper, a level meter, a feeding motor, a stirring machine, a mixing tank, a liquid level meter, a flowmeter, a magnetic valve, a tap water pipe, a liquid preparation feeding pipe, an eclectic cabinet, a touch screen operating system, an alarm, a plunger pump, a mixed liquid output pipe and a pressure meter. A repairing method comprises the steps of: adding a solid preparation into the dry powder hopper, adding the preparation into the mixing tank by using the feeding motor, introducing water or other solvent through a water inlet pipe, stirring by using the stirring machine to ensure that the solid preparation is fully dissolved in water or other solvents to prepare a repairing preparation with required concentration; or directly adding a liquid preparation into the mixing tank, introducing the water or other solvents through the water inlet pipe to ensure that the liquid preparation is diluted into the repairing preparation with the required concentration. Through automatically or manually starting the plunger pump, the repairing preparation is pressurized and injected into a polluted medium through the mixed liquid output pipe and reacts with pollutants in the medium, thus the purpose of efficient repairing is achieved.
Owner:北京九州科睿科技有限公司

Electron blocking layer structure of photoelectric device

The invention provides an electron blocking layer structure of a photoelectric device. The electron blocking layer structure is characterized in that structure matching between a quantum well and a P layer is achieved through adjusting a lattice structure and a band gap as much as possible; meanwhile, the formation of a polarized electric field is reduced, the formation of a negative charge area in an electron blocking layer is weakened as much as possible, and further the efficiency is improved; the electron leakage caused by energy band bending of the electron blocking layer and the increment of hole potential energy of the P layer are weakened. The electron blocking layer structure of the photoelectric device adopts AlInGaN or AlInGaN/InGaN super-lattice structure growth, wherein the In component is less than or equal to 10 percent; the Al component is less than or equal to 40 percent; the gradual distribution of the In component and the Al component exists in the electron blocking layer, and gradual change principles of the In component and the Al component are mutually independent; as for the electron blocking layer with an AlInGaN/InGaN super-lattice structure, the gradual change of the In component occurs in a super-lattice AlInGaN or a super-lattice AlInGaN/InGaN or in both the super-lattice AlInGaN and the super-lattice AlInGaN/InGaN.
Owner:西安利科光电科技有限公司
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